CHARGE INJECTION IN CURRENT COPIER CELLS

被引：6

作者：

MACQ, D

JESPERS, P

机构：

[1] Université Catholique de Louvain—Microelectronics Laboratory, B-1348 Louvain-la-Neuve, 3, pl. du Levant

来源：

ELECTRONICS LETTERS | 1993年 / 29卷 / 09期

关键词：

CURRENT COPIERS; ANALOG CIRCUITS; CIRCUIT DESIGN;

D O I：

10.1049/el:19930522

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The current copier cell [1] is a versatile building block increasingly used in many analogue CMOS circuits. However, charge injection, noise, Early effect and leakage current affect its accuracy. The Letter focuses on charge injection. A new model, derived from the work of Vittoz [2] and Sheu et al. [3], is presented to predict the actual partition of the injected charges. The results are compared with experimental measurements on a test circuit.

引用

页码：780 / 781

页数：2

共 5 条

[1] CHARGE PUMPING IN MOS DEVICES [J].