NEW TENSILE TESTING DEVICE USABLE FROM ROOM-TEMPERATURE TO -150DEGREES C IN AN ELECTRON-MICROSCOPE

被引：9

作者：

SAKA, H

NODA, K

IMURA, T

机构：

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS | 1972年 / 11卷 / 09期

关键词：

D O I：

10.1143/JJAP.11.1357

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

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页码：1357 / &

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