STM STUDY OF THE EFFECTS OF ETCHING ON THE SURFACE OF KISH-GRAPHITE

被引:10
作者
KOGA, Y [1 ]
MIYAZAKI, Y [1 ]
NAKAGIRI, N [1 ]
机构
[1] JRDC,YOSHIDA NANOMECHANISM PROJECT,TSUKUBA RES CONSORTIUM,TSUKUBA,IBARAKI 30026,JAPAN
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 1988年 / 27卷 / 06期
关键词
D O I
10.1143/JJAP.27.L976
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:L976 / L978
页数:3
相关论文
共 10 条
  • [1] FLOAT POLISHING OF OPTICAL-MATERIALS
    BENNETT, JM
    SHAFFER, JJ
    SHIBANO, Y
    NAMBA, Y
    [J]. APPLIED OPTICS, 1987, 26 (04): : 696 - 703
  • [2] TUNNELING THROUGH A CONTROLLABLE VACUUM GAP
    BINNIG, G
    ROHRER, H
    GERBER, C
    WEIBEL, E
    [J]. APPLIED PHYSICS LETTERS, 1982, 40 (02) : 178 - 180
  • [3] BINNIG G, 1982, HELV PHYS ACTA, V55, P726
  • [4] SCANNING TUNNELING MICROSCOPY
    BINNIG, G
    ROHRER, H
    [J]. SURFACE SCIENCE, 1983, 126 (1-3) : 236 - 244
  • [5] SURFACE-MORPHOLOGY OF OXIDIZED AND ION-ETCHED SILICON BY SCANNING TUNNELING MICROSCOPY
    FEENSTRA, RM
    OEHRLEIN, GS
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1985, 3 (04): : 1136 - 1137
  • [6] SURFACE-MORPHOLOGY OF GAAS(110) BY SCANNING TUNNELING MICROSCOPY
    FEENSTRA, RM
    FEIN, AP
    [J]. PHYSICAL REVIEW B, 1985, 32 (02): : 1394 - 1396
  • [7] SURFACE-ROUGHNESS STANDARDS, OBTAINED WITH THE SCANNING TUNNELING MICROSCOPE OPERATED AT ATMOSPHERIC AIR-PRESSURE
    GARCIA, N
    BARO, AM
    MIRANDA, R
    ROHRER, H
    GERBER, C
    CANTU, RG
    PENA, JL
    [J]. METROLOGIA, 1985, 21 (03) : 135 - 138
  • [8] SCANNING TUNNELING MICROSCOPE COMBINED WITH SCANNING ELECTRON-MICROSCOPE
    ICHINOKAWA, T
    MIYAZAKI, Y
    KOGA, Y
    [J]. ULTRAMICROSCOPY, 1987, 23 (01) : 115 - 118
  • [9] MORI Y, 1985, J JAPAN SOC PRECISIO, V51, P1187
  • [10] SPUTTERING MEASUREMENTS ON CONTROLLED THERMONUCLEAR REACTOR MATERIALS USING AUGER-ELECTRON SPECTROSCOPY
    SMITH, JN
    MEYER, CH
    LAYTON, JK
    [J]. NUCLEAR TECHNOLOGY, 1976, 29 (03) : 318 - 321