COATINGS FOR OPTICAL APPLICATIONS PRODUCED BY ION-BEAM SPUTTER DEPOSITION

被引:11
作者
BECKER, J [1 ]
SCHEUER, V [1 ]
机构
[1] TH DARMSTADT,INST ANGEW PHYS LICHT & TEILCHENOPT,W-6100 DARMSTADT,GERMANY
来源
APPLIED OPTICS | 1990年 / 29卷 / 28期
关键词
Absorption; Contamination analysis; Damage thresholds; Ion beam sputter deposition; Scattering;
D O I
10.1364/AO.29.004303
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Ion beam sputter deposition (IBSD) is a useful technique for producing high performance optical coatings. It is possible with relatively simple methods to get a reasonable deposition rate over a sufficiently large area., However, thin films produced with this coating method had a relatively high amount of contaminants. The contaminants were analyzed by various techniques mainly by total reflection x-ray fluorescence. The influence of the contaminants on the performance of the optical coatings proved to be surprisingly low. Optical properties were investigated, mainly the refractive index, the absorption coefficient at 0.514 μm, the scattering behavior, and the damage threshold against high-power laser pulses at 1.06 nm. © 1990 Optical Society of America.
引用
收藏
页码:4303 / 4309
页数:7
相关论文
共 29 条
  • [1] METHOD FOR QUANTITATIVE X-RAY-FLUORESCENCE ANALYSIS IN NANOGRAM REGION
    AIGINGER, H
    WOBRAUSC.P
    [J]. NUCLEAR INSTRUMENTS & METHODS, 1974, 114 (01): : 157 - 158
  • [2] MULTIPLE DETERMINATION OF THE OPTICAL-CONSTANTS OF THIN-FILM COATING MATERIALS
    ARNDT, DP
    AZZAM, RMA
    BENNETT, JM
    BORGOGNO, JP
    CARNIGLIA, CK
    CASE, WE
    DOBROWOLSKI, JA
    GIBSON, UJ
    HART, TT
    HO, FC
    HODGKIN, VA
    KLAPP, WP
    MACLEOD, HA
    PELLETIER, E
    PURVIS, MK
    QUINN, DM
    STROME, DH
    SWENSON, R
    TEMPLE, PA
    THONN, TF
    [J]. APPLIED OPTICS, 1984, 23 (20): : 3571 - 3596
  • [3] BARNES SE, 1987, P IPAT 87 BRIGHTON
  • [4] BENNETT JM, 1983, P SOC PHOTO-OPT INST, V401, P234, DOI 10.1117/12.935524
  • [5] EBERT J, 1983, COMMUNICATION
  • [6] RELATIONSHIP OF THE TOTAL INTEGRATED SCATTERING FROM MULTILAYER-COATED OPTICS TO ANGLE OF INCIDENCE, POLARIZATION, CORRELATION LENGTH, AND ROUGHNESS CROSS-CORRELATION PROPERTIES
    ELSON, JM
    RAHN, JP
    BENNETT, JM
    [J]. APPLIED OPTICS, 1983, 22 (20): : 3207 - 3219
  • [7] RELATION BETWEEN THE ANGULAR-DEPENDENCE OF SCATTERING AND THE STATISTICAL PROPERTIES OF OPTICAL-SURFACES
    ELSON, JM
    BENNETT, JM
    [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1979, 69 (01) : 31 - 47
  • [8] ELSON JM, 1979, APPLIED OPTICS OPTIC
  • [9] 1.06-MU-M LASER DAMAGE OF THIN-FILM OPTICAL COATINGS - A ROUND-ROBIN EXPERIMENT INVOLVING VARIOUS PULSE LENGTHS AND BEAM DIAMETERS
    GUENTHER, KH
    HUMPHERYS, TW
    BALMER, J
    BETTIS, JR
    CASPARIS, E
    EBERT, J
    EICHNER, M
    GUENTHER, AH
    KIESEL, E
    KUEHNEL, R
    MILAM, D
    RYSECK, W
    SEITEL, SC
    STEWART, AF
    WEBER, H
    WEBER, HP
    WIRTENSON, GR
    WOOD, RM
    [J]. APPLIED OPTICS, 1984, 23 (21): : 3743 - 3752
  • [10] TECHNOLOGY AND APPLICATIONS OF BROAD-BEAM ION SOURCES USED IN SPUTTERING .2. APPLICATIONS
    HARPER, JME
    CUOMO, JJ
    KAUFMAN, HR
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1982, 21 (03): : 737 - 756