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WIDEBAND MONITORING AND MEASURING SYSTEM FOR OPTICAL COATINGS

被引：23
作者：
LI, L
YEN, YH
机构：
来源：
APPLIED OPTICS | 1989年 / 28卷 / 14期
关键词：
D O I：
10.1364/AO.28.002889
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：2889 / 2894
页数：6
相关论文
共 7 条
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    BORGOGNO, JP
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    LAZARIDES, B
    PELLETIER, E
    ROCHE, P
    [J]. APPLIED OPTICS, 1981, 20 (01): : 90 - 94
  • [2] AUTOMATIC-DETERMINATION OF THE OPTICAL-CONSTANTS OF INHOMOGENEOUS THIN-FILMS
    BORGOGNO, JP
    LAZARIDES, B
    PELLETIER, E
    [J]. APPLIED OPTICS, 1982, 21 (22): : 4020 - 4029
  • [3] FLORY F, 1983, P SOC PHOTOOPT INSTR, V403, P109
  • [4] TANG JF, 1984, APPLIED THIN FIOLM O, P466
  • [5] NON-QUARTERWAVE MULTILAYER FILTERS - OPTICAL MONITORING WITH A MINICOMPUTER ALLOWING CORRECTION OF THICKNESS ERRORS
    VIDAL, B
    PELLETIER, E
    [J]. APPLIED OPTICS, 1979, 18 (22) : 3857 - 3862
  • [6] WIDEBAND OPTICAL MONITORING OF NON-QUARTERWAVE MULTILAYER FILTERS
    VIDAL, B
    FORNIER, A
    PELLETIER, E
    [J]. APPLIED OPTICS, 1979, 18 (22): : 3851 - 3856
  • [7] OPTICAL MONITORING OF NON-QUARTERWAVE MULTILAYER FILTERS
    VIDAL, B
    FORNIER, A
    PELLETIER, E
    [J]. APPLIED OPTICS, 1978, 17 (07) : 1038 - 1047
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