ANALYSIS OF THE 3-DIMENSIONAL ELECTRON-DISTRIBUTION IN SILICON USING DIRECTIONAL COMPTON PROFILE MEASUREMENTS

被引：36

作者：

HANSEN, NK ^{[1
]}

PATTISON, P ^{[1
]}

SCHNEIDER, JR ^{[1
]}

机构：

[1] HAHN MEITNER INST KERNFORSCH BERLIN GMBH, D-1000 BERLIN 39, FED REP GER

来源：

ZEITSCHRIFT FUR PHYSIK B-CONDENSED MATTER | 1987年 / 66卷 / 03期

关键词：

D O I：

10.1007/BF01305420

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

引用

页码：305 / 315

页数：11

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