TRANSFORMATION OF AMORPHOUS SNOX FILMS STUDIED BY ELECTRICAL-RESISTIVITY AND OPTICAL-TRANSMISSION

被引：1

作者：

MURANAKA, S ^{[1
]}

OKA, Y ^{[1
]}

TAMADA, O ^{[1
]}

机构：

[1] KYOTO UNIV,GRAD SCH HUMAN & ENVIRONM STUDIES,KYOTO 606,JAPAN

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1994年 / 33卷 / 3A期

关键词：

AMORPHOUS SNO(X); CRYSTALLIZATION; THIN FILMS; ELECTRICAL RESISTIVITY; OPTICAL TRANSMISSION;

D O I：

10.1143/JJAP.33.1307

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The electrical resistivity and optical transmission of reactively evaporated amorphous SnO(x) films were measured as a function of the temperature. The films showed two drastic changes in both the electrical resistivity and optical transmission. The results indicated that the films were oxidized at about 250-degrees-C and then crystallized at about 400-degrees-C.

引用

页码：1307 / 1308

页数：2

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