RIM PHASE-SHIFT MASK COMBINED WITH OFF-AXIS ILLUMINATION - A PATH TO 0.5-LAMBDA NUMERICAL APERTURE GEOMETRIES

被引:4
作者
BRUNNER, TA
机构
关键词
MICROLITHOGRAPHY; OPTICAL LITHOGRAPHY; PHASE-SHIFT MASKS; OFF-AXIS ILLUMINATION; IMAGE FORMATION; SIMULATION;
D O I
10.1117/12.145956
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Phase-shift mask (PSM) approaches can be classified as either strong or weak. Weak PSM approaches, which are attractive because of their universal applicability to any pattern, are addressed. A simple design algorithm for rim PSM, called biased rim design (BiRD), is described. When used with normal stepper illumination (sigma=0.5), the modest benefits of rim PSMs are of questionable value in many cases. However, theoretical considerations show a synergy of weak PSM combined with off-axis illumination. One specific combination, termed BiRD/QUEST, is explored through a series of simulations. These results suggest that a properly biased weak PSM with appropriate illumination will allow robust manufacturing of 0.5lambda/NA lithographic patterns.
引用
收藏
页码:2337 / 2343
页数:7
相关论文
共 11 条
[1]   SPATIAL-FILTERING FOR DEPTH OF FOCUS AND RESOLUTION ENHANCEMENT IN OPTICAL LITHOGRAPHY [J].
FUKUDA, H ;
TERASAWA, T ;
OKAZAKI, S .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (06) :3113-3116
[2]  
INOKUCHI K, 1991, 1991 INT C SOL STAT, P92
[3]   PHOTOLITHOGRAPHY SYSTEM USING A COMBINATION OF MODIFIED ILLUMINATION AND PHASE-SHIFT MASK [J].
KAMON, K ;
MIYAMOTO, T ;
MYOI, Y ;
NAGATA, H ;
KOTANI, N ;
TANAKA, M .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1992, 31 (12B) :4131-4136
[4]   IMPROVING RESOLUTION IN PHOTOLITHOGRAPHY WITH A PHASE-SHIFTING MASK [J].
LEVENSON, MD ;
VISWANATHAN, NS ;
SIMPSON, RA .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1982, 29 (12) :1828-1836
[5]  
LIN BJ, 1992, SOLID STATE TECHNOL, V35, P43
[6]  
MACK CA, 1993, P SOC PHOTO-OPT INS, V1809, P229, DOI 10.1117/12.142144
[7]  
Nakagawa K., 1991, International Electron Devices Meeting 1991. Technical Digest (Cat. No.91CH3075-9), P51, DOI 10.1109/IEDM.1991.235426
[8]  
NISTLER J, 1991, P SOC PHOTO-OPT INS, V1604, P236
[9]  
NOGUCHI M, 1992, P SOC PHOTO-OPT INS, V1674, P92, DOI 10.1117/12.130312
[10]  
SHIRAISHI N, 1992, P SOC PHOTO-OPT INS, V1674, P741, DOI 10.1117/12.130364