共 28 条
- [1] SIMULTANEOUS ANALYSIS OF MULTIPLE EXTENDED X-RAY-ABSORPTION FINE-STRUCTURE SPECTRA - APPLICATION TO STUDIES OF BURIED GE-SI INTERFACES [J]. PHYSICAL REVIEW B, 1992, 45 (23): : 13579 - 13589
- [5] THE MARTENSITIC-TRANSFORMATION IN SILICON .2. CRYSTALLOGRAPHIC ANALYSIS [J]. ACTA METALLURGICA ET MATERIALIA, 1990, 38 (02): : 323 - 328
- [6] DYNNA M, 1993, UNPUB
- [7] ELECTRON-MICROSCOPE INVESTIGATION OF MICROPLASTIC DEFORMATION MECHANISMS OF SILICON BY INDENTATION [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1972, 14 (01): : 317 - 330
- [9] STRAIN RELAXATION KINETICS IN SI1-XGEX/SI HETEROSTRUCTURES [J]. JOURNAL OF APPLIED PHYSICS, 1991, 70 (04) : 2136 - 2151