APPLICATION OF KRAMERS-KRONIG ANALYSIS TO THE PHOTOREFLECTANCE SPECTRA OF HEAVILY-DOPED GAAS/SI-GAAS STRUCTURES

被引:27
作者
JEZIERSKI, K [1 ]
MARKIEWICZ, P [1 ]
MISIEWICZ, J [1 ]
PANEK, M [1 ]
SCIANA, B [1 ]
KORBUTOWICZ, R [1 ]
TLACZALA, M [1 ]
机构
[1] WROCLAW TECH UNIV,INST ELECTRON TECHNOL,PL-50370 WROCLAW,POLAND
关键词
D O I
10.1063/1.359503
中图分类号
O59 [应用物理学];
学科分类号
摘要
The photoreflectance spectra for heavily doped p-type GaAs/SI-GaAs structures have been measured at room temperature for the energies in the vicinity of the GaAs band gap. The complex photoreflectance function is defined and determined by means of a Kramers-Krönig analysis from the measured photoreflectance spectra. The modulus of the complex photoreflectance function gives us the critical point energy whereas the phase of this function can be used for a topographical study of the homogeneity of the internal electric field in the structure. © 1995 American Institute of Physics.
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页码:4139 / 4141
页数:3
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