MECHANISTICS OF EARLY-STAGE GROWTH OF ALN ON ALUMINA .2. TMAL AND NH3

被引:18
作者
BERTOLET, DC [1 ]
LIU, H [1 ]
ROGERS, JW [1 ]
机构
[1] UNIV WASHINGTON,DEPT CHEM ENGN,BF-10,SEATTLE,WA 98195
关键词
D O I
10.1021/cm00036a020
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The reactions of trimethylaluminum (TMAl) and ammonia (NH3) on gamma-alumina were studied by Fourier transform infrared spectroscopy, thermal desorption spectroscopy, and X-ray photoelectron spectroscopy (XPS) to explore their feasibility as precursors for the low-temperature growth of AlN. Upon exposure of TMAl and NH3, covalently bonded Al-N networks are formed at room temperature. This reaction efficiency is enhanced by a factor of 4 when the NH3 is dosed with the substrate at 600 K. An atomic layer growth process involving cyclic processing at 600 K yielded site-specific reaction of the TMAl, followed by facile reaction of the ammonia to create new sites for the TMAl reaction. XPS results confirmed the presence of AlN.
引用
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页码:1814 / 1818
页数:5
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共 43 条
[41]   METALORGANIC SURFACE CHEMICAL ADSORPTION DEPOSITION OF AIN FILMS BY AMMONIA AND TRIMETHYLALUMINUM [J].
YU, ZJ ;
EDGAR, JH ;
AHMED, AU ;
RYS, A .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1991, 138 (01) :196-199
[42]   ORGANOMETALLIC PRECURSORS IN THE GROWTH OF EPITAXIAL THIN-FILMS OF GROUPS III-V SEMICONDUCTORS BY METAL ORGANIC-CHEMICAL VAPOR-DEPOSITION [J].
ZANELLA, P ;
ROSSETTO, G ;
BRIANESE, N ;
OSSOLA, F ;
PORCHIA, M ;
WILLIAMS, JO .
CHEMISTRY OF MATERIALS, 1991, 3 (02) :225-242
[43]  
1974, STANDARD IR GRATING