WEIBULL ACCELERATED LIFE TESTS WHEN THERE ARE COMPETING CAUSES OF FAILURE

被引:45
作者
KLEIN, JP [1 ]
BASU, AP [1 ]
机构
[1] UNIV MISSOURI,DEPT STAT,COLUMBIA,MO 65211
来源
COMMUNICATIONS IN STATISTICS PART A-THEORY AND METHODS | 1981年 / 10卷 / 20期
关键词
D O I
10.1080/03610928108828174
中图分类号
O21 [概率论与数理统计]; C8 [统计学];
学科分类号
020208 ; 070103 ; 0714 ;
摘要
引用
收藏
页码:2073 / 2100
页数:28
相关论文
共 21 条
[11]   ANALYSIS OF ACCELERATED LIFE TEST DATA .1. ARRHENIUS MODEL AND GRAPHICAL METHODS [J].
NELSON, W .
IEEE TRANSACTIONS ON ELECTRICAL INSULATION, 1971, EI 6 (04) :165-&
[12]  
NELSON W, 1972, TECHNOMETRICS, V14, P247
[13]   LINEAR ESTIMATION OF A REGRESSION RELATIONSHIP FROM CENSORED DATA .2. BEST LINEAR UNBIASED ESTIMATION AND THEORY [J].
NELSON, W ;
HAHN, GJ .
TECHNOMETRICS, 1973, 15 (01) :133-150
[15]   ANALYSIS OF ACCELERATED LIFE TEST DATA .3. PRODUCT COMPARISONS AND CHECKS ON VALIDITY OF MODEL AND DATA [J].
NELSON, W .
IEEE TRANSACTIONS ON ELECTRICAL INSULATION, 1972, EI 7 (02) :99-&
[16]   ANALYSIS OF ACCELERATED LIFE TEST DATA .2. NUMERICAL METHODS AND TEST PLANNING [J].
NELSON, W .
IEEE TRANSACTIONS ON ELECTRICAL INSULATION, 1972, EI 7 (01) :36-&
[17]  
NELSON WB, 1974, 73CRD034 GEN EL CO C
[18]  
NELSON WB, 1970, 71C011 GEN EL CO COR
[19]  
NELSON WB, 1973, 73CRD001 GEN EL CO C
[20]  
NELSON WB, 1974, 74CRD160 GEN EL CO C