PREPARATION, STRUCTURE, AND APPLICATIONS OF THIN FILMS OF SILICON MONOXIDE AND TITANIUM DIOXIDE

被引：120

作者：

HASS, G

机构：

来源：

关键词：

D O I：

10.1111/j.1151-2916.1950.tb14151.x

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：353 / 360

页数：8

共 29 条

[21] Fourier analysis of X-ray patterns of soda-silica glass [J].

Warren, BE ;

Biscoe, J .

[22] X-ray determination of the structure of liquids and glass [J].

Warren, BE .

[23] The structure of silica glass by X-ray diffraction studies [J].

Warren, BE ;

Biscoe, J .

[24]

WARREN BE, 1938, CER ABSTR, V17, P87

[25]

ZAPFFE CA, 1942, IRON AGE, V149, P29

[26]

ZAPFFE CA, 1942, IRON AGE, V149, P34

[27]

ZINTL E, 1940, Z ANORG ALLG CHEM, V245, P1

[28] Surface studies with the electron microscope [J].

Zworykin, VK ;

Ramberg, EG .

[29]

ZWORYKIN VK, 1942, CER ABSTR, V21, P20