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REFLECTOMETER FOR ABSOLUTE SILICON RADIOMETRY

被引：3
作者：
GARDNER, JL
机构：
[1] CSIRO, National Measurement Laboratory, Lindfield, NSW, 2070
来源：
APPLIED OPTICS | 1991年 / 30卷 / 16期
关键词：
D O I：
10.1364/AO.30.002067
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
A simple sphere-based reflectometer for the determination of the reflectance of silicon photodiodes at normal incidence is described.
引用
收藏
页码：2067 / 2068
页数：2
相关论文
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