INDUCED JUNCTION (INVERSION LAYER) PHOTODIODE SELF-CALIBRATION

被引：17

作者：

BOOKER, RL

GEIST, J

机构：

来源：

APPLIED OPTICS | 1984年 / 23卷 / 12期

关键词：

D O I：

10.1364/AO.23.001940

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：1940 / 1945

页数：6

共 13 条

[1] COMPLETE COLLECTION OF MINORITY-CARRIERS FROM THE INVERSION LAYER IN INDUCED JUNCTION DIODES [J].

GEIST, J ;

LIANG, E ;

SCHAEFER, AR .

JOURNAL OF APPLIED PHYSICS, 1981, 52 (07) :4879-4881

[2] ELIMINATION OF INTERFACE RECOMBINATION IN OXIDE PASSIVATED SILICON P+N PHOTO-DIODES BY STORAGE OF NEGATIVE CHARGE ON THE OXIDE SURFACE [J].

GEIST, J ;

FARMER, AJD ;

MARTIN, PJ ;

WILKINSON, FJ ;

COLLOCOTT, SJ .

APPLIED OPTICS, 1982, 21 (06) :1130-1135

[3] SPECTRAL RESPONSE SELF-CALIBRATION AND INTERPOLATION OF SILICON PHOTO-DIODES [J].

GEIST, J ;

ZALEWSKI, EF ;

SCHAEFER, AR .

APPLIED OPTICS, 1980, 19 (22) :3795-3799

[4] SILICON PHOTO-DIODE FRONT REGION COLLECTION EFFICIENCY MODELS [J].

GEIST, J .

JOURNAL OF APPLIED PHYSICS, 1980, 51 (07) :3993-3995

[5] PHYSICS OF PHOTON-FLUX MEASUREMENTS WITH SILICON PHOTO-DIODES [J].

GEIST, J ;

GLADDEN, WK ;

ZALEWSKI, EF .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1982, 72 (08) :1068-1075

[6] SILICON UV-PHOTODIODES USING NATURAL INVERSION LAYERS [J].

HANSEN, TE .

PHYSICA SCRIPTA, 1978, 18 (06) :471-475

[7] SILICON PHOTO-DIODE ABSOLUTE SPECTRAL RESPONSE SELF-CALIBRATION USING A FILTERED TUNGSTEN SOURCE [J].

HUGHES, CG .

APPLIED OPTICS, 1982, 21 (12) :2129-2132

[8] SILICON DETECTOR NONLINEARITY AND RELATED EFFECTS [J].

SCHAEFER, AR ;

ZALEWSKI, EF ;

GEIST, J .

APPLIED OPTICS, 1983, 22 (08) :1232-1236

[9] DEGRADATION OF NATIVE OXIDE PASSIVATED SILICON PHOTODIODES BY REPEATED OXIDE BIAS [J].

VERDEBOUT, J ;

BOOKER, RL .

JOURNAL OF APPLIED PHYSICS, 1984, 55 (02) :406-412

[10] THE NEAR ULTRAVIOLET QUANTUM YIELD OF SILICON [J].

WILKINSON, FJ ;

FARMER, AJD ;

GEIST, J .

JOURNAL OF APPLIED PHYSICS, 1983, 54 (02) :1172-1174

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