DEFECT AND PHONON EFFECTS IN IN1-XGAXP P-N TUNNEL JUNCTIONS

被引:9
作者
KORB, HW
ANDREWS, AM
HOLONYAK, N
BURNHAM, RD
DUKE, CB
KLEIMAN, GG
机构
关键词
D O I
10.1016/0038-1098(71)90172-4
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
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页码:1531 / +
页数:1
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共 29 条
[1]  
ALFEROV ZI, 1967, FIZ TVERD TELA+, V9, P208
[2]  
ARCHER RJ, 1970, MAY EL SOC M, P182
[3]   STIMULATED EMISSION IN IN1-XGAXP [J].
BURNHAM, RD ;
HOLONYAK, N ;
KEUNE, DL ;
SCIFRES, DR ;
DAPKUS, PD .
APPLIED PHYSICS LETTERS, 1970, 17 (10) :430-&
[4]   SPECTRAL BEHAVIOR, CARRIER LIFETIME, AND PULSED AND CW LASER OPERATION (77 DEGREES K) OF IN1-XGAXP [J].
BURNHAM, RD ;
HOLONYAK, N ;
KEUNE, DL ;
SCIFRES, DR .
APPLIED PHYSICS LETTERS, 1971, 18 (04) :160-&
[5]   EXCESS TUNNEL CURRENT IN SILICON ESAKI JUNCTIONS [J].
CHYNOWETH, A ;
LOGAN, RA ;
FELDMANN, WL .
PHYSICAL REVIEW, 1961, 121 (03) :684-&
[6]   EXCESS AND HUMP CURRENT IN ESAKI DIODES [J].
CLAASSEN, RS .
JOURNAL OF APPLIED PHYSICS, 1961, 32 (11) :2372-&
[7]   GAAS-GAASP HETEROSTRUCTURE INJECTION LASERS [J].
CRAFORD, MG ;
GROVES, WO ;
FOX, MJ .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1971, 118 (02) :355-+
[8]   Tunneling Spectroscopy in degenerate p-type sificon [J].
Cullen, D. E. ;
Wolf, E. L. ;
Compton, W. Dale .
PHYSICAL REVIEW B-SOLID STATE, 1970, 2 (08) :3157-3169
[9]  
CULLEN DE, 1970, THESIS U ILLINOIS
[10]   ANALYSIS OF TUNNELING MEASUREMENT OF ELECTRONIC SELF-ENERGIES DUE TO INTERACTIONS OF ELECTRONS AND HOLES WITH OPTICAL PHONONS IN SEMICONDUCTORS [J].
DAVIS, LC ;
DUKE, CB .
PHYSICAL REVIEW, 1969, 184 (03) :764-+