VACUUM ANNEALING EFFECTS ON STRUCTURAL AND ELECTRICAL-PROPERTIES OF REACTIVELY EVAPORATED INDIUM TIN OXIDE

被引：1

作者：

DINH, NN ^{[1
]}

BICH, VT ^{[1
]}

HOANG, NH ^{[1
]}

HOAI, TX ^{[1
]}

QUYNH, VN ^{[1
]}

CHANH, NV ^{[1
]}

机构：

[1] INST GEOL & MINERALS,HANOI,VIETNAM

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1988年 / 106卷 / 02期

关键词：

D O I：

10.1002/pssa.2211060247

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：K147 / K151

页数：5

共 14 条

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[5]

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[7]

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[8]

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