COPPER PRECIPITATE COLONIES IN SILICON

[1] HANSEN M, 1968, CONSTITUTION BINARY

[2] THE PROJECTION TOPOGRAPH - A NEW METHOD IN X-RAY DIFFRACTION MICRORADIOGRAPHY [J]. ACTA CRYSTALLOGRAPHICA, 1959, 12 (03): : 249 - 250

[3] A METHOD FOR THE EXAMINATION OF CRYSTAL SECTIONS USING PENETRATING CHARACTERISTIC X-RADIATION [J]. ACTA METALLURGICA, 1957, 5 (07): : 358 - 364

[4] LUNDE G, 1968, SOLID STATE TECHNOL, V11, P32

[5] PRECIPITATION IN HIGH-PURITY SILICON SINGLE CRYSTALS [J]. JOURNAL OF APPLIED PHYSICS, 1971, 42 (09) : 3562 - &

[6] PRECIPITATE COLONIES IN SILICON [J]. JOURNAL OF APPLIED PHYSICS, 1972, 43 (04) : 2005 - &

[7] NES E, 1970, THESIS U CALIFORNIA

[8] Pearson W.B., 1967, HDB LATTICE SPACINGS

[9] SIRTL E, 1961, Z METALLKD, V52, P529

[10] SROB L, 1967, SOLID STATE ELECTRON, V10, P991

[1] HANSEN M, 1968, CONSTITUTION BINARY

[2] THE PROJECTION TOPOGRAPH - A NEW METHOD IN X-RAY DIFFRACTION MICRORADIOGRAPHY [J]. ACTA CRYSTALLOGRAPHICA, 1959, 12 (03): : 249 - 250

[3] A METHOD FOR THE EXAMINATION OF CRYSTAL SECTIONS USING PENETRATING CHARACTERISTIC X-RADIATION [J]. ACTA METALLURGICA, 1957, 5 (07): : 358 - 364

[4] LUNDE G, 1968, SOLID STATE TECHNOL, V11, P32

[5] PRECIPITATION IN HIGH-PURITY SILICON SINGLE CRYSTALS [J]. JOURNAL OF APPLIED PHYSICS, 1971, 42 (09) : 3562 - &

[6] PRECIPITATE COLONIES IN SILICON [J]. JOURNAL OF APPLIED PHYSICS, 1972, 43 (04) : 2005 - &

[7] NES E, 1970, THESIS U CALIFORNIA

[8] Pearson W.B., 1967, HDB LATTICE SPACINGS

[9] SIRTL E, 1961, Z METALLKD, V52, P529

[10] SROB L, 1967, SOLID STATE ELECTRON, V10, P991