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LOW-DOSE SI ION-IMPLANTATION INTO SEMI-INSULATING LEC GAAS
被引:10
作者
:
YAMAZAKI, H
论文数:
0
引用数:
0
h-index:
0
YAMAZAKI, H
HONDA, T
论文数:
0
引用数:
0
h-index:
0
HONDA, T
MIYAZAWA, S
论文数:
0
引用数:
0
h-index:
0
MIYAZAWA, S
机构
:
来源
:
ELECTRONICS LETTERS
|
1981年
/ 17卷
/ 21期
关键词
:
D O I
:
10.1049/el:19810570
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:817 / 819
页数:3
相关论文
共 7 条
[1]
CHALMERS B, 1964, PRINCIPLES SOLIDIFIC, P140
[2]
SURFACE AND INTERFACE DEPLETION CORRECTIONS TO FREE CARRIER-DENSITY DETERMINATIONS BY HALL MEASUREMENTS
CHANDRA, A
论文数:
0
引用数:
0
h-index:
0
机构:
Cornell University, School of Electrical Engineering, Ithaca
CHANDRA, A
WOOD, CEC
论文数:
0
引用数:
0
h-index:
0
机构:
Cornell University, School of Electrical Engineering, Ithaca
WOOD, CEC
WOODARD, DW
论文数:
0
引用数:
0
h-index:
0
机构:
Cornell University, School of Electrical Engineering, Ithaca
WOODARD, DW
EASTMAN, LF
论文数:
0
引用数:
0
h-index:
0
机构:
Cornell University, School of Electrical Engineering, Ithaca
EASTMAN, LF
[J].
SOLID-STATE ELECTRONICS,
1979,
22
(07)
: 645
-
650
[3]
GROWTH OF HIGH-PURITY SEMI-INSULATING BULK GAAS FOR INTEGRATED-CIRCUIT APPLICATIONS
FAIRMAN, RD
论文数:
0
引用数:
0
h-index:
0
FAIRMAN, RD
CHEN, RT
论文数:
0
引用数:
0
h-index:
0
CHEN, RT
OLIVER, JR
论文数:
0
引用数:
0
h-index:
0
OLIVER, JR
CHEN, DR
论文数:
0
引用数:
0
h-index:
0
CHEN, DR
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1981,
28
(02)
: 135
-
140
[4]
HIGH-PURITY SEMI-INSULATING GAAS MATERIAL FOR MONOLITHIC MICROWAVE INTEGRATED-CIRCUITS
HOBGOOD, HM
论文数:
0
引用数:
0
h-index:
0
HOBGOOD, HM
ELDRIDGE, GW
论文数:
0
引用数:
0
h-index:
0
ELDRIDGE, GW
BARRETT, DL
论文数:
0
引用数:
0
h-index:
0
BARRETT, DL
THOMAS, RN
论文数:
0
引用数:
0
h-index:
0
THOMAS, RN
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1981,
28
(02)
: 140
-
149
[5]
UNIFIED MECHANISM FOR SCHOTTKY-BARRIER FORMATION AND III-V-OXIDE INTERFACE STATES
SPICER, WE
论文数:
0
引用数:
0
h-index:
0
SPICER, WE
LINDAU, I
论文数:
0
引用数:
0
h-index:
0
LINDAU, I
SKEATH, P
论文数:
0
引用数:
0
h-index:
0
SKEATH, P
SU, CY
论文数:
0
引用数:
0
h-index:
0
SU, CY
CHYE, P
论文数:
0
引用数:
0
h-index:
0
CHYE, P
[J].
PHYSICAL REVIEW LETTERS,
1980,
44
(06)
: 420
-
423
[6]
SURFACE-STATES AT THE NORMAL-GAAS-SIO2 INTERFACE FROM CONDUCTANCE AND CAPACITANCE MEASUREMENTS
STREEVER, RL
论文数:
0
引用数:
0
h-index:
0
STREEVER, RL
BRESLIN, JT
论文数:
0
引用数:
0
h-index:
0
BRESLIN, JT
AHLSTROM, EH
论文数:
0
引用数:
0
h-index:
0
AHLSTROM, EH
[J].
SOLID-STATE ELECTRONICS,
1980,
23
(08)
: 863
-
868
[7]
GROWTH AND CHARACTERIZATION OF LARGE DIAMETER UNDOPED SEMI-INSULATING GAAS FOR DIRECT ION-IMPLANTED FET TECHNOLOGY
THOMAS, RN
论文数:
0
引用数:
0
h-index:
0
THOMAS, RN
HOBGOOD, HM
论文数:
0
引用数:
0
h-index:
0
HOBGOOD, HM
ELDRIDGE, GW
论文数:
0
引用数:
0
h-index:
0
ELDRIDGE, GW
BARRETT, DL
论文数:
0
引用数:
0
h-index:
0
BARRETT, DL
BRAGGINS, TT
论文数:
0
引用数:
0
h-index:
0
BRAGGINS, TT
[J].
SOLID-STATE ELECTRONICS,
1981,
24
(05)
: 387
-
&
←
1
→
共 7 条
[1]
CHALMERS B, 1964, PRINCIPLES SOLIDIFIC, P140
[2]
SURFACE AND INTERFACE DEPLETION CORRECTIONS TO FREE CARRIER-DENSITY DETERMINATIONS BY HALL MEASUREMENTS
CHANDRA, A
论文数:
0
引用数:
0
h-index:
0
机构:
Cornell University, School of Electrical Engineering, Ithaca
CHANDRA, A
WOOD, CEC
论文数:
0
引用数:
0
h-index:
0
机构:
Cornell University, School of Electrical Engineering, Ithaca
WOOD, CEC
WOODARD, DW
论文数:
0
引用数:
0
h-index:
0
机构:
Cornell University, School of Electrical Engineering, Ithaca
WOODARD, DW
EASTMAN, LF
论文数:
0
引用数:
0
h-index:
0
机构:
Cornell University, School of Electrical Engineering, Ithaca
EASTMAN, LF
[J].
SOLID-STATE ELECTRONICS,
1979,
22
(07)
: 645
-
650
[3]
GROWTH OF HIGH-PURITY SEMI-INSULATING BULK GAAS FOR INTEGRATED-CIRCUIT APPLICATIONS
FAIRMAN, RD
论文数:
0
引用数:
0
h-index:
0
FAIRMAN, RD
CHEN, RT
论文数:
0
引用数:
0
h-index:
0
CHEN, RT
OLIVER, JR
论文数:
0
引用数:
0
h-index:
0
OLIVER, JR
CHEN, DR
论文数:
0
引用数:
0
h-index:
0
CHEN, DR
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1981,
28
(02)
: 135
-
140
[4]
HIGH-PURITY SEMI-INSULATING GAAS MATERIAL FOR MONOLITHIC MICROWAVE INTEGRATED-CIRCUITS
HOBGOOD, HM
论文数:
0
引用数:
0
h-index:
0
HOBGOOD, HM
ELDRIDGE, GW
论文数:
0
引用数:
0
h-index:
0
ELDRIDGE, GW
BARRETT, DL
论文数:
0
引用数:
0
h-index:
0
BARRETT, DL
THOMAS, RN
论文数:
0
引用数:
0
h-index:
0
THOMAS, RN
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1981,
28
(02)
: 140
-
149
[5]
UNIFIED MECHANISM FOR SCHOTTKY-BARRIER FORMATION AND III-V-OXIDE INTERFACE STATES
SPICER, WE
论文数:
0
引用数:
0
h-index:
0
SPICER, WE
LINDAU, I
论文数:
0
引用数:
0
h-index:
0
LINDAU, I
SKEATH, P
论文数:
0
引用数:
0
h-index:
0
SKEATH, P
SU, CY
论文数:
0
引用数:
0
h-index:
0
SU, CY
CHYE, P
论文数:
0
引用数:
0
h-index:
0
CHYE, P
[J].
PHYSICAL REVIEW LETTERS,
1980,
44
(06)
: 420
-
423
[6]
SURFACE-STATES AT THE NORMAL-GAAS-SIO2 INTERFACE FROM CONDUCTANCE AND CAPACITANCE MEASUREMENTS
STREEVER, RL
论文数:
0
引用数:
0
h-index:
0
STREEVER, RL
BRESLIN, JT
论文数:
0
引用数:
0
h-index:
0
BRESLIN, JT
AHLSTROM, EH
论文数:
0
引用数:
0
h-index:
0
AHLSTROM, EH
[J].
SOLID-STATE ELECTRONICS,
1980,
23
(08)
: 863
-
868
[7]
GROWTH AND CHARACTERIZATION OF LARGE DIAMETER UNDOPED SEMI-INSULATING GAAS FOR DIRECT ION-IMPLANTED FET TECHNOLOGY
THOMAS, RN
论文数:
0
引用数:
0
h-index:
0
THOMAS, RN
HOBGOOD, HM
论文数:
0
引用数:
0
h-index:
0
HOBGOOD, HM
ELDRIDGE, GW
论文数:
0
引用数:
0
h-index:
0
ELDRIDGE, GW
BARRETT, DL
论文数:
0
引用数:
0
h-index:
0
BARRETT, DL
BRAGGINS, TT
论文数:
0
引用数:
0
h-index:
0
BRAGGINS, TT
[J].
SOLID-STATE ELECTRONICS,
1981,
24
(05)
: 387
-
&
←
1
→