共 9 条
- [1] CAMBRIA TD, 1987, SOLID STATE TECH SEP, P133
- [2] INTEGRATED-CIRCUIT REPAIR USING FOCUSED ION-BEAM MILLING [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1986, 4 (01): : 181 - 184
- [3] MONTE-CARLO SIMULATION OF ENERGETIC ION BEHAVIOR IN AMORPHOUS TARGETS [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1983, 22 (02): : 329 - 334
- [4] KAWAMOTO K, COMMUNICATION
- [5] THE FOCUSED ION-BEAM AS AN INTEGRATED-CIRCUIT RESTRUCTURING TOOL [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1986, 4 (01): : 176 - 180
- [6] MULER KP, 1986, MICROELECTRONIC ENG, V5, P481
- [7] INTEGRATED-CIRCUIT DIAGNOSIS USING FOCUSED ION-BEAMS [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1986, 4 (01): : 185 - 188
- [8] YAMAGUCHI H, 1985, J VAC SCI TECHNOL B, V3