MEASUREMENT OF MINORITY-CARRIER CAPTURE CROSS-SECTIONS AND APPLICATION TO GOLD AND PLATINUM IN SILICON

被引：21

作者：

BROTHERTON, SD

BRADLEY, P

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1982年 / 53卷 / 03期

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D O I：

10.1063/1.330655

中图分类号：

O59 [应用物理学];

学科分类号：

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页码：1543 / 1553

页数：11

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