A STUDY OF THE DEEP CARRIER TRAPS IN A TE-SE-CD RECTIFYING STRUCTURE

被引：5

作者：

HOUSIN, M ^{[1
]}

BASTIDE, G ^{[1
]}

SAGNES, G ^{[1
]}

ROUZEYRE, M ^{[1
]}

CHAMPNESS, CH ^{[1
]}

ELAZAB, MI ^{[1
]}

机构：

[1] MCGILL UNIV,DEPT ELECT ENGN,MONTREAL H3A 2A7,QUEBEC,CANADA

来源：

JOURNAL OF APPLIED PHYSICS | 1980年 / 51卷 / 09期

关键词：

D O I：

10.1063/1.328325

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：4885 / 4888

页数：4

共 9 条

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