A STUDY OF THE DEEP CARRIER TRAPS IN A TE-SE-CD RECTIFYING STRUCTURE

被引:5
作者
HOUSIN, M [1 ]
BASTIDE, G [1 ]
SAGNES, G [1 ]
ROUZEYRE, M [1 ]
CHAMPNESS, CH [1 ]
ELAZAB, MI [1 ]
机构
[1] MCGILL UNIV,DEPT ELECT ENGN,MONTREAL H3A 2A7,QUEBEC,CANADA
关键词
D O I
10.1063/1.328325
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
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页码:4885 / 4888
页数:4
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