SOLID SAMPLING ELECTROTHERMAL VAPORIZATION FOR SAMPLE INTRODUCTION IN INDUCTIVELY-COUPLED PLASMA-ATOMIC EMISSION-SPECTROMETRY AND INDUCTIVELY-COUPLED PLASMA-MASS SPECTROMETRY
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作者:
MOENS, L
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机构:Laboratory of Analytical Chemistry, Ghent University, B-9000 Ghent
MOENS, L
VERREPT, P
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机构:Laboratory of Analytical Chemistry, Ghent University, B-9000 Ghent
VERREPT, P
BOONEN, S
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机构:Laboratory of Analytical Chemistry, Ghent University, B-9000 Ghent
BOONEN, S
VANHAECKE, F
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机构:Laboratory of Analytical Chemistry, Ghent University, B-9000 Ghent
VANHAECKE, F
DAMS, R
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机构:Laboratory of Analytical Chemistry, Ghent University, B-9000 Ghent
DAMS, R
机构:
[1] Laboratory of Analytical Chemistry, Ghent University, B-9000 Ghent
Solid sampling using electrothermal vaporization is an attractive sample introduction method for atomic absorption spectrometry (AAS), inductively coupled plasma atomic emission spectrometry (ICP-AES) and inductively coupled plasma mass spectrometry (ICP-MS). For AAS, the method is well; established. The techniques needed to apply SS-ETV in ICP-based methods are described, with the emphasis on the coupling of different types of ETV-devices to the inductively coupled plasma torch and on the requirements for the spectrometer and the data acquisition and handling system. Though standardization is not straightforward, it is shown that standard addition and external calibration with solid standards yield accurate results. The latter is demonstrated by the analysis of standard reference materials. Figures of merit for SS-ETV-ICP-AES and SS-ETV-ICP-MS are presented. The literature concerning ICP-AES and ICP-MS (methods and applications) is briefly reviewed and new results of SS-ETV-ICP-MS analysis of SRMs are presented.