SILICIDE STRUCTURAL EVOLUTION IN HIGH-DOSE COBALT-IMPLANTED SI(100) CRYSTALS

被引:14
作者
TAN, ZQ
BUDNICK, JI
SANCHEZ, FH
TOURILLON, G
NAMAVAR, F
HAYDEN, HC
机构
[1] UNIV CONNECTICUT,INST MAT SCI,STORRS,CT 06269
[2] LAB UTILISAT RAYONNEMENT ELECTROMAGNET,F-91405 ORSAY,FRANCE
来源
PHYSICAL REVIEW B | 1989年 / 40卷 / 09期
关键词
D O I
10.1103/PhysRevB.40.6368
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:6368 / 6373
页数:6
相关论文
共 16 条
[1]  
BEVINGTON PR, 1969, DATA REDUCTION ERROR, pCH5
[2]   MICROSTRUCTURE OF HETEROEPITAXIAL SI/COSI2/SI FORMED BY CO IMPLANTATION INTO (100) AND (111) SI [J].
BULLELIEUWMA, CWT ;
VANOMMEN, AH ;
VANIJZENDOORN, LJ .
APPLIED PHYSICS LETTERS, 1989, 54 (03) :244-246
[3]  
BUNKER BA, 1988, MRS BULL, V13, P36
[4]   KINETICS OF FORMATION AND PROPERTIES OF EPITAXIAL COSI2 FILMS ON SI (111) [J].
DAVITAYA, FA ;
DELAGE, S ;
ROSENCHER, E ;
DERRIEN, J .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1985, 3 (02) :770-773
[5]   EXTENDED X-RAY ABSORPTION FINE-STRUCTURE - ITS STRENGTHS AND LIMITATIONS AS A STRUCTURAL TOOL [J].
LEE, PA ;
CITRIN, PH ;
EISENBERGER, P ;
KINCAID, BM .
REVIEWS OF MODERN PHYSICS, 1981, 53 (04) :769-806
[6]   SYNTHESIS OF NISI2 BY 6 MEV NI IMPLANTATION INTO SILICON [J].
LINDNER, JKN ;
KAAT, EHT .
JOURNAL OF MATERIALS RESEARCH, 1988, 3 (06) :1238-1246
[7]  
MURARKA SP, 1983, SILICIDES VLSI APPLI, P30
[8]   NUCLEAR-RESONANCE PROFILING OF HIGH-DOSE IMPLANTS OF AL IN SI [J].
NAMAVAR, F ;
BUDNICK, JI ;
SANCHEZ, FH ;
OTTER, FA .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1985, 7-8 (MAR) :357-360
[9]  
NAMAVAR F, 1987, MATERIALS RES SOC S, V74
[10]  
NAMAVAR F, UNPUB