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ION-BEAM OXIDATION OF NB-BASED JOSEPHSON-JUNCTIONS
被引:8
作者
:
HERWIG, R
论文数:
0
引用数:
0
h-index:
0
HERWIG, R
机构
:
来源
:
ELECTRONICS LETTERS
|
1980年
/ 16卷
/ 22期
关键词
:
D O I
:
10.1049/el:19800604
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:850 / 851
页数:2
相关论文
共 5 条
[1]
FABRICATION AND PROPERTIES OF NIOBIUM JOSEPHSON TUNNEL-JUNCTIONS
[J].
BROOM, RF
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, THOMAS J WATSON RES CTR, DIV RES, YORKTOWN HTS, NY 10598 USA
IBM CORP, THOMAS J WATSON RES CTR, DIV RES, YORKTOWN HTS, NY 10598 USA
BROOM, RF
;
LAIBOWITZ, RB
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, THOMAS J WATSON RES CTR, DIV RES, YORKTOWN HTS, NY 10598 USA
IBM CORP, THOMAS J WATSON RES CTR, DIV RES, YORKTOWN HTS, NY 10598 USA
LAIBOWITZ, RB
;
MOHR, TO
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, THOMAS J WATSON RES CTR, DIV RES, YORKTOWN HTS, NY 10598 USA
IBM CORP, THOMAS J WATSON RES CTR, DIV RES, YORKTOWN HTS, NY 10598 USA
MOHR, TO
;
WALTER, W
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, THOMAS J WATSON RES CTR, DIV RES, YORKTOWN HTS, NY 10598 USA
IBM CORP, THOMAS J WATSON RES CTR, DIV RES, YORKTOWN HTS, NY 10598 USA
WALTER, W
.
IBM JOURNAL OF RESEARCH AND DEVELOPMENT,
1980,
24
(02)
:212
-222
[2]
FABRICATION PROCESS FOR JOSEPHSON INTEGRATED-CIRCUITS
[J].
GREINER, JH
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
GREINER, JH
;
KIRCHER, CJ
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
KIRCHER, CJ
;
KLEPNER, SP
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
KLEPNER, SP
;
LAHIRI, SK
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
LAHIRI, SK
;
WARNECKE, AJ
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
WARNECKE, AJ
;
BASAVAIAH, S
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
BASAVAIAH, S
;
YEN, ET
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
YEN, ET
;
BAKER, JM
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
BAKER, JM
;
BROSIOUS, PR
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
BROSIOUS, PR
;
HUANG, HCW
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
HUANG, HCW
;
MURAKAMI, M
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
MURAKAMI, M
;
AMES, I
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
AMES, I
.
IBM JOURNAL OF RESEARCH AND DEVELOPMENT,
1980,
24
(02)
:195
-205
[3]
PENETRATION DEPTH MEASUREMENTS ON TYPE-2 SUPERCONDUCTING FILMS
[J].
HENKELS, WH
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
HENKELS, WH
;
KIRCHER, CJ
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
KIRCHER, CJ
.
IEEE TRANSACTIONS ON MAGNETICS,
1977,
13
(01)
:63
-66
[4]
SEMICONDUCTOR APPLICATIONS OF THIN-FILMS DEPOSITED BY NEUTRALIZED ION-BEAM SPUTTERING
[J].
SITES, JR
论文数:
0
引用数:
0
h-index:
0
机构:
COLORADO STATE UNIV,DEPT PHYS,FT COLLINS,CO 80523
COLORADO STATE UNIV,DEPT PHYS,FT COLLINS,CO 80523
SITES, JR
.
THIN SOLID FILMS,
1977,
45
(01)
:47
-53
[5]
WEINACHT W, 1969, PHYS STAT SOL, V33, pK169
←
1
→
共 5 条
[1]
FABRICATION AND PROPERTIES OF NIOBIUM JOSEPHSON TUNNEL-JUNCTIONS
[J].
BROOM, RF
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, THOMAS J WATSON RES CTR, DIV RES, YORKTOWN HTS, NY 10598 USA
IBM CORP, THOMAS J WATSON RES CTR, DIV RES, YORKTOWN HTS, NY 10598 USA
BROOM, RF
;
LAIBOWITZ, RB
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, THOMAS J WATSON RES CTR, DIV RES, YORKTOWN HTS, NY 10598 USA
IBM CORP, THOMAS J WATSON RES CTR, DIV RES, YORKTOWN HTS, NY 10598 USA
LAIBOWITZ, RB
;
MOHR, TO
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, THOMAS J WATSON RES CTR, DIV RES, YORKTOWN HTS, NY 10598 USA
IBM CORP, THOMAS J WATSON RES CTR, DIV RES, YORKTOWN HTS, NY 10598 USA
MOHR, TO
;
WALTER, W
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, THOMAS J WATSON RES CTR, DIV RES, YORKTOWN HTS, NY 10598 USA
IBM CORP, THOMAS J WATSON RES CTR, DIV RES, YORKTOWN HTS, NY 10598 USA
WALTER, W
.
IBM JOURNAL OF RESEARCH AND DEVELOPMENT,
1980,
24
(02)
:212
-222
[2]
FABRICATION PROCESS FOR JOSEPHSON INTEGRATED-CIRCUITS
[J].
GREINER, JH
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
GREINER, JH
;
KIRCHER, CJ
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
KIRCHER, CJ
;
KLEPNER, SP
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
KLEPNER, SP
;
LAHIRI, SK
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
LAHIRI, SK
;
WARNECKE, AJ
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
WARNECKE, AJ
;
BASAVAIAH, S
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
BASAVAIAH, S
;
YEN, ET
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
YEN, ET
;
BAKER, JM
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
BAKER, JM
;
BROSIOUS, PR
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
BROSIOUS, PR
;
HUANG, HCW
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
HUANG, HCW
;
MURAKAMI, M
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
MURAKAMI, M
;
AMES, I
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
IBM CORP, GEN PROD DIV LAB, SAN JOSE, CA 95114 USA
AMES, I
.
IBM JOURNAL OF RESEARCH AND DEVELOPMENT,
1980,
24
(02)
:195
-205
[3]
PENETRATION DEPTH MEASUREMENTS ON TYPE-2 SUPERCONDUCTING FILMS
[J].
HENKELS, WH
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
HENKELS, WH
;
KIRCHER, CJ
论文数:
0
引用数:
0
h-index:
0
机构:
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
KIRCHER, CJ
.
IEEE TRANSACTIONS ON MAGNETICS,
1977,
13
(01)
:63
-66
[4]
SEMICONDUCTOR APPLICATIONS OF THIN-FILMS DEPOSITED BY NEUTRALIZED ION-BEAM SPUTTERING
[J].
SITES, JR
论文数:
0
引用数:
0
h-index:
0
机构:
COLORADO STATE UNIV,DEPT PHYS,FT COLLINS,CO 80523
COLORADO STATE UNIV,DEPT PHYS,FT COLLINS,CO 80523
SITES, JR
.
THIN SOLID FILMS,
1977,
45
(01)
:47
-53
[5]
WEINACHT W, 1969, PHYS STAT SOL, V33, pK169
←
1
→