AN APPROACH TO DETERMINING IMPACT IONIZATION RATES IN SEMICONDUCTOR JUNCTIONS

被引：4

作者：

ITO, M

MIKAWA, T

WADA, O

机构：

来源：

SOLID-STATE ELECTRONICS | 1987年 / 30卷 / 09期

关键词：

D O I：

10.1016/0038-1101(87)90133-X

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：969 / 971

页数：3

共 9 条

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