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III-V COMPOUND SEMICONDUCTOR-DEVICES - OPTICAL-DETECTORS
被引:66
作者
:
STILLMAN, GE
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS, MAT RES LAB, URBANA, IL 61801 USA
STILLMAN, GE
ROBBINS, VM
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS, MAT RES LAB, URBANA, IL 61801 USA
ROBBINS, VM
TABATABAIE, N
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS, MAT RES LAB, URBANA, IL 61801 USA
TABATABAIE, N
机构
:
[1]
UNIV ILLINOIS, MAT RES LAB, URBANA, IL 61801 USA
[2]
UNIV ILLINOIS, COORDINATED SCI LAB, URBANA, IL 61801 USA
来源
:
IEEE TRANSACTIONS ON ELECTRON DEVICES
|
1984年
/ 31卷
/ 11期
关键词
:
D O I
:
10.1109/T-ED.1984.21765
中图分类号
:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号
:
0808 ;
0809 ;
摘要
:
引用
收藏
页码:1643 / 1655
页数:13
相关论文
共 68 条
[1]
MICROWAVE PHOTODIODES EXHIBITING MICROPLASMA-FREE CARRIER MULTIPLICATION (SI P-N JUNCTIONS 3 GC/SEC E)
ANDERSON, LK
论文数:
0
引用数:
0
h-index:
0
ANDERSON, LK
MCMULLIN, PG
论文数:
0
引用数:
0
h-index:
0
MCMULLIN, PG
DASARO, LA
论文数:
0
引用数:
0
h-index:
0
DASARO, LA
GOETZBERGER, A
论文数:
0
引用数:
0
h-index:
0
GOETZBERGER, A
[J].
APPLIED PHYSICS LETTERS,
1965,
6
(04)
: 62
-
+
[2]
ANDERSON LK, 1966, P IEEE, V5, P1335
[3]
IONIZATION COEFFICIENT MEASUREMENT IN GAAS BY USING MULTIPLICATION NOISE CHARACTERISTICS
ANDO, H
论文数:
0
引用数:
0
h-index:
0
ANDO, H
KANBE, H
论文数:
0
引用数:
0
h-index:
0
KANBE, H
[J].
SOLID-STATE ELECTRONICS,
1981,
24
(07)
: 629
-
634
[4]
ANTYPAS GA, 1973, I PHYS C SER, V17, P48
[5]
IONIZATION COEFFICIENTS OF ELECTRONS AND HOLES IN INP
ARMIENTO, CA
论文数:
0
引用数:
0
h-index:
0
机构:
Lincoln Laboratory, Massachusetts Institute of Technology, Lexington
ARMIENTO, CA
GROVES, SH
论文数:
0
引用数:
0
h-index:
0
机构:
Lincoln Laboratory, Massachusetts Institute of Technology, Lexington
GROVES, SH
HURWITZ, CE
论文数:
0
引用数:
0
h-index:
0
机构:
Lincoln Laboratory, Massachusetts Institute of Technology, Lexington
HURWITZ, CE
[J].
APPLIED PHYSICS LETTERS,
1979,
35
(04)
: 333
-
335
[6]
IMPACT IONIZATION IN (100)-ORIENTED, (110)-ORIENTED AND (111)-ORIENTED INP AVALANCHE PHOTO-DIODES
ARMIENTO, CA
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,LINCOLN LAB,LEXINGTON,MA 02173
MIT,LINCOLN LAB,LEXINGTON,MA 02173
ARMIENTO, CA
GROVES, SH
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,LINCOLN LAB,LEXINGTON,MA 02173
MIT,LINCOLN LAB,LEXINGTON,MA 02173
GROVES, SH
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1983,
30
(11)
: 1607
-
1607
[7]
IMPACT IONIZATION IN (100)-ORIENTED, (110)-ORIENTED, AND (111)-ORIENTED INP AVALANCHE PHOTO-DIODES
ARMIENTO, CA
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,LINCOLN LAB,LEXINGTON,MA 02173
MIT,LINCOLN LAB,LEXINGTON,MA 02173
ARMIENTO, CA
GROVES, SH
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,LINCOLN LAB,LEXINGTON,MA 02173
MIT,LINCOLN LAB,LEXINGTON,MA 02173
GROVES, SH
[J].
APPLIED PHYSICS LETTERS,
1983,
43
(02)
: 198
-
200
[8]
NOISE AND MULTIPLICATION MEASUREMENTS IN INSB AVALANCHE PHOTODIODES
BAERTSCH, RD
论文数:
0
引用数:
0
h-index:
0
BAERTSCH, RD
[J].
JOURNAL OF APPLIED PHYSICS,
1967,
38
(11)
: 4267
-
+
[9]
EXPERIMENTAL-DETERMINATION OF IMPACT IONIZATION COEFFICIENTS IN (100) GAAS
BULMAN, GE
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,MAT RES LAB,URBANA,IL 61801
BULMAN, GE
ROBBINS, VM
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,MAT RES LAB,URBANA,IL 61801
ROBBINS, VM
BRENNAN, KF
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,MAT RES LAB,URBANA,IL 61801
BRENNAN, KF
HESS, K
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,MAT RES LAB,URBANA,IL 61801
HESS, K
STILLMAN, GE
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,MAT RES LAB,URBANA,IL 61801
STILLMAN, GE
[J].
IEEE ELECTRON DEVICE LETTERS,
1983,
4
(06)
: 181
-
185
[10]
ELECTRO-ABSORPTION PRODUCED MIXED INJECTION AND ITS EFFECT ON THE DETERMINATION OF IONIZATION COEFFICIENTS
BULMAN, GE
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS, MAT RES LAB, URBANA, IL 61801 USA
BULMAN, GE
COOK, LW
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS, MAT RES LAB, URBANA, IL 61801 USA
COOK, LW
STILLMAN, GE
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS, MAT RES LAB, URBANA, IL 61801 USA
STILLMAN, GE
[J].
SOLID-STATE ELECTRONICS,
1982,
25
(12)
: 1189
-
1200
←
1
2
3
4
5
6
7
→
共 68 条
[1]
MICROWAVE PHOTODIODES EXHIBITING MICROPLASMA-FREE CARRIER MULTIPLICATION (SI P-N JUNCTIONS 3 GC/SEC E)
ANDERSON, LK
论文数:
0
引用数:
0
h-index:
0
ANDERSON, LK
MCMULLIN, PG
论文数:
0
引用数:
0
h-index:
0
MCMULLIN, PG
DASARO, LA
论文数:
0
引用数:
0
h-index:
0
DASARO, LA
GOETZBERGER, A
论文数:
0
引用数:
0
h-index:
0
GOETZBERGER, A
[J].
APPLIED PHYSICS LETTERS,
1965,
6
(04)
: 62
-
+
[2]
ANDERSON LK, 1966, P IEEE, V5, P1335
[3]
IONIZATION COEFFICIENT MEASUREMENT IN GAAS BY USING MULTIPLICATION NOISE CHARACTERISTICS
ANDO, H
论文数:
0
引用数:
0
h-index:
0
ANDO, H
KANBE, H
论文数:
0
引用数:
0
h-index:
0
KANBE, H
[J].
SOLID-STATE ELECTRONICS,
1981,
24
(07)
: 629
-
634
[4]
ANTYPAS GA, 1973, I PHYS C SER, V17, P48
[5]
IONIZATION COEFFICIENTS OF ELECTRONS AND HOLES IN INP
ARMIENTO, CA
论文数:
0
引用数:
0
h-index:
0
机构:
Lincoln Laboratory, Massachusetts Institute of Technology, Lexington
ARMIENTO, CA
GROVES, SH
论文数:
0
引用数:
0
h-index:
0
机构:
Lincoln Laboratory, Massachusetts Institute of Technology, Lexington
GROVES, SH
HURWITZ, CE
论文数:
0
引用数:
0
h-index:
0
机构:
Lincoln Laboratory, Massachusetts Institute of Technology, Lexington
HURWITZ, CE
[J].
APPLIED PHYSICS LETTERS,
1979,
35
(04)
: 333
-
335
[6]
IMPACT IONIZATION IN (100)-ORIENTED, (110)-ORIENTED AND (111)-ORIENTED INP AVALANCHE PHOTO-DIODES
ARMIENTO, CA
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,LINCOLN LAB,LEXINGTON,MA 02173
MIT,LINCOLN LAB,LEXINGTON,MA 02173
ARMIENTO, CA
GROVES, SH
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,LINCOLN LAB,LEXINGTON,MA 02173
MIT,LINCOLN LAB,LEXINGTON,MA 02173
GROVES, SH
[J].
IEEE TRANSACTIONS ON ELECTRON DEVICES,
1983,
30
(11)
: 1607
-
1607
[7]
IMPACT IONIZATION IN (100)-ORIENTED, (110)-ORIENTED, AND (111)-ORIENTED INP AVALANCHE PHOTO-DIODES
ARMIENTO, CA
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,LINCOLN LAB,LEXINGTON,MA 02173
MIT,LINCOLN LAB,LEXINGTON,MA 02173
ARMIENTO, CA
GROVES, SH
论文数:
0
引用数:
0
h-index:
0
机构:
MIT,LINCOLN LAB,LEXINGTON,MA 02173
MIT,LINCOLN LAB,LEXINGTON,MA 02173
GROVES, SH
[J].
APPLIED PHYSICS LETTERS,
1983,
43
(02)
: 198
-
200
[8]
NOISE AND MULTIPLICATION MEASUREMENTS IN INSB AVALANCHE PHOTODIODES
BAERTSCH, RD
论文数:
0
引用数:
0
h-index:
0
BAERTSCH, RD
[J].
JOURNAL OF APPLIED PHYSICS,
1967,
38
(11)
: 4267
-
+
[9]
EXPERIMENTAL-DETERMINATION OF IMPACT IONIZATION COEFFICIENTS IN (100) GAAS
BULMAN, GE
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,MAT RES LAB,URBANA,IL 61801
BULMAN, GE
ROBBINS, VM
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,MAT RES LAB,URBANA,IL 61801
ROBBINS, VM
BRENNAN, KF
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,MAT RES LAB,URBANA,IL 61801
BRENNAN, KF
HESS, K
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,MAT RES LAB,URBANA,IL 61801
HESS, K
STILLMAN, GE
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS,MAT RES LAB,URBANA,IL 61801
STILLMAN, GE
[J].
IEEE ELECTRON DEVICE LETTERS,
1983,
4
(06)
: 181
-
185
[10]
ELECTRO-ABSORPTION PRODUCED MIXED INJECTION AND ITS EFFECT ON THE DETERMINATION OF IONIZATION COEFFICIENTS
BULMAN, GE
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS, MAT RES LAB, URBANA, IL 61801 USA
BULMAN, GE
COOK, LW
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS, MAT RES LAB, URBANA, IL 61801 USA
COOK, LW
STILLMAN, GE
论文数:
0
引用数:
0
h-index:
0
机构:
UNIV ILLINOIS, MAT RES LAB, URBANA, IL 61801 USA
STILLMAN, GE
[J].
SOLID-STATE ELECTRONICS,
1982,
25
(12)
: 1189
-
1200
←
1
2
3
4
5
6
7
→