共 17 条
- [1] ADLER D, 1985, PHYSICS DISORDERED M, P287
- [2] BARANOVSKII SD, IN PRESS
- [3] LOW-TEMPERATURE ELECTRON-TRANSPORT NEAR THE MOBILITY EDGE OF AMORPHOUS-SILICON [J]. PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1986, 54 (04): : L113 - L118
- [4] DRIFT-MOBILITY MEASUREMENTS IN AMORPHOUS-SEMICONDUCTORS USING TRAVELING-WAVE METHOD [J]. PHYSICAL REVIEW B, 1983, 28 (08): : 4900 - 4902
- [5] ANALYSIS OF THE TRAVELING-WAVE TECHNIQUE FOR MEASURING MOBILITIES IN LOW-CONDUCTIVITY SEMICONDUCTORS [J]. PHYSICAL REVIEW B, 1984, 29 (12): : 6672 - 6678
- [8] JOHANSON RE, IN PRESS
- [9] OPTICALLY INDUCED FREQUENCY-DEPENDENT LOSS IN HYDROGENATED AMORPHOUS-SILICON [J]. JOURNAL OF PHYSICS C-SOLID STATE PHYSICS, 1988, 21 (36): : L1199 - L1204