MEASUREMENT OF LIFETIME OF PHOTO-INJECTED CARRIERS IN SOLAR-CELLS BY REVERSE VOLTAGE PULSE RESPONSE

被引：10

作者：

DHARIWAL, SR

机构：

来源：

IEE PROCEEDINGS-I COMMUNICATIONS SPEECH AND VISION | 1980年 / 127卷 / 01期

关键词：

D O I：

10.1049/ip-i-1.1980.0004

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：20 / 24

页数：5

共 10 条

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[6] METHODOLOGY FOR EXPERIMENTALLY BASED DETERMINATION OF GAP SHRINKAGE AND EFFECTIVE LIFETIMES IN EMITTER AND BASE OF P-N-JUNCTION SOLAR-CELLS AND OTHER P-N-JUNCTION DEVICES [J].

LINDHOLM, FA ;

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[7]

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NEUGROSCHEL A, 1977, IEEE T ELECTRON DEV, V24, P662, DOI 10.1109/T-ED.1977.18800

[9] DIFFUSION LENGTH AND LIFETIME DETERMINATION IN P-N-JUNCTION SOLAR-CELLS AND DIODES BY FORWARD-BIASED CAPACITANCE MEASUREMENTS [J].

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[10]

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