ANOMALOUS DIFFUSION OF NITROGEN IN NITROGEN-IMPLANTED SILICON

被引:28
作者
HOCKETT, RS [1 ]
机构
[1] MONSANTO ELECTR MAT CO,ST PETERS,MO 63376
关键词
D O I
10.1063/1.101266
中图分类号
O59 [应用物理学];
学科分类号
摘要
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页码:1793 / 1795
页数:3
相关论文
共 7 条
[1]  
CLARK AH, 1968, B AM PHYS SOC, V13, P376
[2]  
DENISOVA NV, 1975, IZV AKAD NAUK SSSR N, V11, P2286
[3]  
HOCKETT RS, 1986, MATER RES SOC S P, V59, P433
[4]  
HOCKETT RS, 1988, SECONDARY ION MASS S, P441
[5]   DIFFUSION-COEFFICIENT OF A PAIR OF NITROGEN-ATOMS IN FLOAT-ZONE SILICON [J].
ITOH, T ;
ABE, T .
APPLIED PHYSICS LETTERS, 1988, 53 (01) :39-41
[6]   NITROGEN-IMPLANTED SILICON .1. DAMAGE ANNEALING AND LATTICE LOCATION [J].
MITCHELL, JB ;
PRONKO, PP ;
SHEWCHUN, J ;
THOMPSON, DA ;
DAVIES, JA .
JOURNAL OF APPLIED PHYSICS, 1975, 46 (01) :332-334
[7]   INFRARED-ABSORPTION BAND FOR SUBSTITUTIONAL NITROGEN IN SILICON [J].
STEIN, HJ .
APPLIED PHYSICS LETTERS, 1985, 47 (12) :1339-1341