THE CHILDREN OF THE STM

被引:37
作者
POOL, R
机构
关键词
D O I
10.1126/science.247.4943.634
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
[No abstract available]
引用
收藏
页码:634 / 636
页数:3
相关论文
共 10 条
[1]   COLLECTION MODE NEAR-FIELD SCANNING OPTICAL MICROSCOPY [J].
BETZIG, E ;
ISAACSON, M ;
LEWIS, A .
APPLIED PHYSICS LETTERS, 1987, 51 (25) :2088-2090
[2]   ATOMIC FORCE MICROSCOPE [J].
BINNIG, G ;
QUATE, CF ;
GERBER, C .
PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933
[3]   THE SCANNING ION-CONDUCTANCE MICROSCOPE [J].
HANSMA, PK ;
DRAKE, B ;
MARTI, O ;
GOULD, SAC ;
PRATER, CB .
SCIENCE, 1989, 243 (4891) :641-643
[4]   MAGNETIC IMAGING BY FORCE MICROSCOPY WITH 1000-A RESOLUTION [J].
MARTIN, Y ;
WICKRAMASINGHE, HK .
APPLIED PHYSICS LETTERS, 1987, 50 (20) :1455-1457
[5]   ATOMIC-SCALE FRICTION OF A TUNGSTEN TIP ON A GRAPHITE SURFACE [J].
MATE, CM ;
MCCLELLAND, GM ;
ERLANDSSON, R ;
CHIANG, S .
PHYSICAL REVIEW LETTERS, 1987, 59 (17) :1942-1945
[6]   MICROSCOPIC IMAGING OF RESIDUAL-STRESS USING A SCANNING PHASE-MEASURING ACOUSTIC MICROSCOPE [J].
MEEKS, SW ;
PETER, D ;
HORNE, D ;
YOUNG, K ;
NOVOTNY, V .
APPLIED PHYSICS LETTERS, 1989, 55 (18) :1835-1837
[7]   CONTACT ELECTRIFICATION USING FORCE MICROSCOPY [J].
TERRIS, BD ;
STERN, JE ;
RUGAR, D ;
MAMIN, HJ .
PHYSICAL REVIEW LETTERS, 1989, 63 (24) :2669-2672
[8]   OPTICAL-ABSORPTION MICROSCOPY AND SPECTROSCOPY WITH NANOMETER RESOLUTION [J].
WEAVER, JMR ;
WALPITA, LM ;
WICKRAMASINGHE, HK .
NATURE, 1989, 342 (6251) :783-785
[9]  
1989, SCIENCE, V243, P609
[10]  
1988, SCIENCE, V241, P25