SURFACE-REACTION INDUCED BY MULTIPLY-CHARGED IONS

被引:9
作者
MOCHIJI, K [1 ]
ITABASHI, N [1 ]
YAMAMOTO, S [1 ]
OCHIAI, I [1 ]
OKUNO, K [1 ]
机构
[1] TOKYO METROPOLITAN UNIV,DEPT PHYS,HACHIOJI,TOKYO 19203,JAPAN
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1994年 / 33卷 / 12B期
关键词
SURFACE REACTION; MULTIPLY-CHARGED ION; ELECTRONIC POTENTIAL ENERGY; ION DESORPTION;
D O I
10.1143/JJAP.33.7108
中图分类号
O59 [应用物理学];
学科分类号
摘要
The surface reactions induced by an electronic potential energy of multiply-charged ions are investigated. A small electron-beam impact type ion source for production of multiply-charged ions was manufactured for this study. The charge state distribution of multiply-charged ions produced in the ion source greatly depends on the sample gas pressure and the potential barrier for ion trapping. In operation with an electron current of 7 mA at 2 keV, the ion-beam currents obtained for Ar5+ and Ar10+ are respectively at least 7 pA and 2 x 10(-3) pA. H+ ion desorption from a lightly etched GaAs surface are observed by bombarding with Ar-q+ ions (q=1-3). The desorption yield of H+ per Ar-q+ increases proportionally with the sixth power of the charge state of Ar-q+. This charge state effect is discussed from the viewpoint of the electronic interaction between the GaAs surface and Ar-q+ ions.
引用
收藏
页码:7108 / 7111
页数:4
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