FULLY ION-IMPLANTED DSA MOS IC

被引:7
作者
OHKURA, I
OHMORI, M
SHIMOTORI, K
NAKANO, T
HAYASHI, Y
TARUI, Y
机构
[1] MITSUBISHI ELECT CORP,LSI DEV LAB,ITAMI,HYOGO,JAPAN
[2] ELECTROTECH LAB,TANASHI,TOKYO,JAPAN
关键词
D O I
10.7567/JJAPS.16S1.167
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:167 / 171
页数:5
相关论文
共 11 条
[1]   STUDIES OF PUSH-OUT EFFECT IN SILICON .1. COMPARISON OF SEQUENTIAL BORON-PHOSPHORUS AND GALLIUM-PHOSPHORUS DIFFUSIONS [J].
JONES, CL ;
WILLOUGHBY, AFW .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1975, 122 (11) :1531-1538
[2]  
KATO T, 1964, JPN J APPL PHYS, V3, P377
[3]   ANALYSIS OF IMPURITY ATOM DISTRIBUTION NEAR DIFFUSION MASK FOR A PLANAR P-N JUNCTION [J].
KENNEDY, DP ;
OBRIEN, RR .
IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1965, 9 (03) :179-&
[4]  
MASUDA H, 1973, J JAPAN SOC APPL P S, V42, P167
[5]   HIGH-SPEED LOGIC LSI USING DIFFUSION SELF-ALIGNED ENHANCEMENT DEPLETION MOS IC [J].
OHTA, K ;
MORIMOTO, M ;
SAITOH, M ;
FUKUDA, T ;
MORINO, A ;
SHIMIZU, K ;
HAYASHI, Y ;
TARUI, Y .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1975, 10 (05) :314-321
[6]   THRESHOLD VOLTAGE CONTROLLABILITY IN DOUBLE-DIFFUSED MOS TRANSISTORS [J].
POCHA, MD ;
GONZALEZ, AG ;
DUTTON, RW .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1974, ED21 (12) :778-784
[7]   EXPERIMENTAL AND THEORETICAL-ANALYSIS OF DOUBLE-DIFFUSED MOS-TRANSISTORS [J].
RODGERS, TJ ;
ASAI, S ;
POCHA, MD ;
DUTTON, RW ;
MEINDL, JD .
IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1975, 10 (05) :322-331
[8]   D-MOS TRANSISTOR FOR MICROWAVE APPLICATIONS [J].
SIGG, HJ ;
VENDELIN, GD ;
CAUGE, TP ;
KOCSIS, J .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1972, ED19 (01) :45-&
[9]  
TARUI Y, 1971, J JAPAN SOC APPL PHY, V40, P193
[10]  
TARUI Y, 1970, J JAPAN SOC APPL P S, V39, P105