INFLUENCE OF HEAT-TREATMENT ON ALUMINUM-OXIDE FILMS ON SILICON

被引:10
作者
KAMOSHID.M
MAYER, JW
MITCHELL, IV
机构
关键词
D O I
10.1063/1.1661386
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:1717 / &
相关论文
共 16 条
[11]   ANALYSIS OF AMORPHOUS LAYERS ON SILICON BY BACKSCATTERING AND CHANNELING EFFECT MEASUREMENTS [J].
MEYER, O ;
GYULAI, J ;
MAYER, JW .
SURFACE SCIENCE, 1970, 22 (02) :263-&
[12]   LINESHAPE EXTRACTION FROM MEV HE+ BACKSCATTERING ENERGY SPECTRA - ALUMINUM OXIDE ON SILICON [J].
MITCHELL, IV ;
KAMOSHIDA, M ;
MAYER, JW .
PHYSICS LETTERS A, 1971, A 35 (01) :21-+
[13]   CHANNELING-EFFECT ANALYSIS OF THIN FILMS ON SILICON - ALUMINUM OXIDE [J].
MITCHELL, IV ;
KAMOSHIDA, M ;
MAYER, JW .
JOURNAL OF APPLIED PHYSICS, 1971, 42 (11) :4378-+
[14]  
NAKANUMAN S, 1970, IEEE J SOLID STATE C, VSC 5, P203
[15]  
SCHMIDT, 1968, IEEE T ELECTRON DEVI, VED15, P290
[16]   PROPERTIES OF ALUMINUM OXIDE OBTAINED BY HYDROLYSIS OF AICI3 [J].
TSUJIDE, T ;
NAKANUMA, S ;
IKUSHIMA, Y .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1970, 117 (05) :703-+