THE RESOLUTION OF A-SI THIN-FILM TRANSISTOR INSTABILITY MECHANISMS

被引：3

作者：

POWELL, MJ

VANBERKEL, C

FRENCH, ID

机构：

来源：

JOURNAL OF NON-CRYSTALLINE SOLIDS | 1987年 / 97-8卷

关键词：

D O I：

10.1016/0022-3093(87)90077-9

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：321 / 324

页数：4

共 10 条

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