FABRICATION OF NANOSTRUCTURES USING ATOMIC-FORCE-MICROSCOPE-BASED LITHOGRAPHY

被引:119
作者
SOHN, LL
WILLETT, RL
机构
[1] AT and T Bell Laboratories, Murray Hill
关键词
D O I
10.1063/1.114731
中图分类号
O59 [应用物理学];
学科分类号
摘要
We describe a novel technique for fabricating metallic nanostructures on an arbitrary substrate using an atomic force microscope (AFM). An AFM is used to plow a pattern through the top of two resist layers spun onto a substrate. The resist is then developed to create a mask through which material can be deposited. By changing the applied force, the top resist-layer thickness, or the development time, the linewidth can be varied. Continuous metallic wires similar to 500 Angstrom x400 Angstrom x15 mu m have been fabricated on bare substrates and between contact pads. (C) 1995 American Institute of Physics.
引用
收藏
页码:1552 / 1554
页数:3
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