REFLECTIVITY OF COATED AND TILTED SEMICONDUCTOR FACETS

被引：17

作者：

BUUS, J

FARRIES, MC

ROBBINS, DJ

机构：

[1] GEC Marconi Materials Technology Ltd., Caswell, Towcester, Northants

来源：

IEEE JOURNAL OF QUANTUM ELECTRONICS | 1991年 / 27卷 / 06期

关键词：

D O I：

10.1109/3.90013

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A comparatively simple model for calculating the reflectivity of coated and tilted semiconductor facets is described. The model takes the two-dimensional waveguide structure into account, includes polarization effects, and can be applied to multilayer coatings. Some examples are discussed.

引用

页码：1837 / 1842

页数：6

共 15 条

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[10] THEORETICAL-ANALYSIS AND FABRICATION OF ANTIREFLECTION COATINGS ON LASER-DIODE FACETS
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MUKAI, T
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