WAVELENGTH-SCANNING POLARIZATION-MODULATION ELLIPSOMETRY - SOME PRACTICAL CONSIDERATIONS

被引：59

作者：

BERMUDEZ, VM

RITZ, VH

机构：

来源：

关键词：

D O I：

10.1364/AO.17.000542

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：542 / 552

页数：11

共 32 条

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ASPNES, DE
STUDNA, AA
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