共 19 条
ELLIPS - FORTRAN SIMULATION OF A POLARIZATION-MODULATION ELLIPSOMETER
被引:8
作者:

BERMUDEZ, VM
论文数: 0 引用数: 0
h-index: 0
机构:
USN,RES LAB,WASHINGTON,DC 20375 USN,RES LAB,WASHINGTON,DC 20375
机构:
[1] USN,RES LAB,WASHINGTON,DC 20375
关键词:
D O I:
10.1016/0010-4655(77)90015-7
中图分类号:
TP39 [计算机的应用];
学科分类号:
081203 ;
0835 ;
摘要:
引用
收藏
页码:207 / 224
页数:18
相关论文
共 19 条
- [1] MEASUREMENT AND CORRECTION OF FIRST-ORDER ERRORS IN ELLIPSOMETRY[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1971, 61 (08) : 1077 - &ASPNES, DE论文数: 0 引用数: 0 h-index: 0
- [2] OPTIMIZING PRECISION OF ROTATING-ANALYZER ELLIPSOMETERS[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1974, 64 (05) : 639 - 646ASPNES, DE论文数: 0 引用数: 0 h-index: 0机构: BELL TEL LABS INC,MURRAY HILL,NJ 07974 BELL TEL LABS INC,MURRAY HILL,NJ 07974
- [3] EFFECTS OF COMPONENT OPTICAL-ACTIVITY IN DATA REDUCTION AND CALIBRATION OF ROTATING-ANALYZER ELLIPSOMETERS[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1974, 64 (06) : 812 - 819ASPNES, DE论文数: 0 引用数: 0 h-index: 0机构: BELL TEL LABS INC,MURRAY HILL,NJ 07974 BELL TEL LABS INC,MURRAY HILL,NJ 07974
- [4] UNIFIED ANALYSIS OF ELLIPSOMETRY ERRORS DUE TO IMPERFECT COMPONENTS, CELL-WINDOW BIREFRINGENCE, AND INCORRECT AZIMUTH ANGLES[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1971, 61 (05) : 600 - &AZZAM, RMA论文数: 0 引用数: 0 h-index: 0BASHARA, NM论文数: 0 引用数: 0 h-index: 0
- [5] ELLIPSOMETRY WITH IMPERFECT COMPONENTS INCLUDING INCOHERENT EFFECTS[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1971, 61 (10) : 1380 - &AZZAM, RMA论文数: 0 引用数: 0 h-index: 0BASHARA, NM论文数: 0 引用数: 0 h-index: 0
- [6] CALIBRATION OF ELLIPSOMETER DIVIDED CIRCLES[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1971, 61 (08) : 1118 - &AZZAM, RMA论文数: 0 引用数: 0 h-index: 0BASHARA, NM论文数: 0 引用数: 0 h-index: 0
- [7] GENERAL TREATMENT OF EFFECT OF CELL WINDOWS IN ELLIPSOMETRY[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1971, 61 (06) : 773 - &AZZAM, RMA论文数: 0 引用数: 0 h-index: 0BASHARA, NM论文数: 0 引用数: 0 h-index: 0
- [8] EFFECTS OF COMPONENT IMPERFECTIONS ON ELLIPSOMETER CALIBRATION[J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1973, 63 (08) : 951 - 957HUNTER, WR论文数: 0 引用数: 0 h-index: 0机构: IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598 IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598
- [9] AN IMPROVED METHOD FOR HIGH REFLECTIVITY ELLIPSOMETRY BASED ON A NEW POLARIZATION MODULATION TECHNIQUE[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1969, 40 (06) : 761 - +JASPERSON, SN论文数: 0 引用数: 0 h-index: 0机构: Palmer Physical Laboratory, Princeton University, PrincetonSCHNATTERLY, SE论文数: 0 引用数: 0 h-index: 0机构: Palmer Physical Laboratory, Princeton University, Princeton
- [10] MODULATED ELLIPSOMETER FOR STUDYING THIN-FILM OPTICAL PROPERTIES AND SURFACE DYNAMICS[J]. SURFACE SCIENCE, 1973, 37 (01) : 548 - 558JASPERSON, SN论文数: 0 引用数: 0 h-index: 0机构: WORCESTER POLYTECH INST, WORCESTER, MA 01609 USABURGE, DK论文数: 0 引用数: 0 h-index: 0机构: WORCESTER POLYTECH INST, WORCESTER, MA 01609 USAOHANDLEY, RC论文数: 0 引用数: 0 h-index: 0机构: WORCESTER POLYTECH INST, WORCESTER, MA 01609 USA