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[2]
Ghezzo M., 1969, British Journal of Applied Physics (Journal of Physics D), V2, P1483
[5]
MEASUREMEMT OF THICKNESS AND REFRACTIVE INDEX OF VERY THIN FILMS AND OPTICAL PROPERTIES OF SURFACES BY ELLIPSOMETRY
[J].
JOURNAL OF RESEARCH OF THE NATIONAL BUREAU OF STANDARDS SECTION A-PHYSICS AND CHEMISTRY,
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:363-+
[6]
[No title captured]