ELECTRONIC SPECKLE PATTERN INTERFEROMETRIC SYSTEM BASED ON A SPECKLE REFERENCE BEAM

被引：65

作者：

SLETTEMOEN, GA

机构：

来源：

APPLIED OPTICS | 1980年 / 19卷 / 04期

关键词：

D O I：

10.1364/AO.19.000616

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

引用

页码：616 / 623

页数：8

共 17 条

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[9] USE OF CHOPPED LASER-LIGHT IN ELECTRONIC SPECKLE PATTERN INTERFEROMETRY [J].

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APPLIED OPTICS, 1979, 18 (14) :2377-2384

[10] VIBRATION PHASE MAPPING USING ELECTRONIC SPECKLE PATTERN INTERFEROMETRY [J].

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