STOICHIOMETRY AND PURITY OF HGI2

被引：28

作者：

DELONG, MC

ROSENBERGER, F

机构：

来源：

MATERIALS RESEARCH BULLETIN | 1981年 / 16卷 / 11期

关键词：

D O I：

10.1016/0025-5408(81)90065-9

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：1445 / 1454

页数：10

共 17 条

[11] PURIFICATION, GROWTH, AND CHARACTERIZATION OF ALPHA-MERCURIC-IODIDE CRYSTALS FOR GAMMA-RAY DETECTION [J].

SCHIEBER, M ;

CARLSTON, RC ;

LAMONDS, HA ;

RANDTKE, PT ;

SCHNEPPLE, FW ;

LLACER, J .

JOURNAL OF CRYSTAL GROWTH, 1974, 24 (OCT) :205-211

[12]

SCHWARZENBACH H, 1957, COMPLEXOMETRIC TITRA

[13] EVAPORATIVE DEGRADATION OF HGI2 X-RAY DETECTORS [J].

SCOTT, RS ;

FREDERICKS, GE .

APPLIED PHYSICS LETTERS, 1975, 27 (02) :99-100

[14] A MERCURIC IODIDE (HGI2) X-RAY SPECTROMETER WITH DRAIN FEEDBACK PRE-AMPLIFICATION [J].

SLAPA, M ;

HAHN, G ;

CHWASZCZEWSKA, J ;

DABROWSKI, AJ ;

IWANCZYK, JS ;

HUTH, GC .

NUCLEAR INSTRUMENTS & METHODS, 1980, 176 (03) :567-570

[15] NATIVE DEFECT COMPENSATION IN HGI2 CRYSTALS [J].

WHITED, RC ;

VANDENBERG, L .

IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1977, 24 (01) :165-167

[16]

YOU KT, UNPUBLISHED

[17]

1974, REAGENT CHEM

← 1 2 →