PURE LINEAR-POLARIZATION IMAGING IN NEAR-FIELD SCANNING OPTICAL MICROSCOPY

被引:39
作者
VAEZIRAVANI, M
TOLEDOCROW, R
机构
[1] Center for Imaging Science, Rochester Institute of Technology, Rochester, NY 14623-0887
关键词
D O I
10.1063/1.110378
中图分类号
O59 [应用物理学];
学科分类号
摘要
The design and theory of operation of a new form of near field polarizing optical microscope are presented. The system uses electro-optic premodulation of light to generate two simultaneous complementary images of samples. This affords the capability to obtain a final output signal which is a linear representation of the sample birefringence, and is independent of the sample transmissivity/reflectivity. A number of images are presented.
引用
收藏
页码:138 / 140
页数:3
相关论文
共 18 条
[1]   COLLECTION MODE NEAR-FIELD SCANNING OPTICAL MICROSCOPY [J].
BETZIG, E ;
ISAACSON, M ;
LEWIS, A .
APPLIED PHYSICS LETTERS, 1987, 51 (25) :2088-2090
[2]   COMBINED SHEAR FORCE AND NEAR-FIELD SCANNING OPTICAL MICROSCOPY [J].
BETZIG, E ;
FINN, PL ;
WEINER, JS .
APPLIED PHYSICS LETTERS, 1992, 60 (20) :2484-2486
[3]   BREAKING THE DIFFRACTION BARRIER - OPTICAL MICROSCOPY ON A NANOMETRIC SCALE [J].
BETZIG, E ;
TRAUTMAN, JK ;
HARRIS, TD ;
WEINER, JS ;
KOSTELAK, RL .
SCIENCE, 1991, 251 (5000) :1468-1470
[4]   NEAR-FIELD MAGNETOOPTICS AND HIGH-DENSITY DATA-STORAGE [J].
BETZIG, E ;
TRAUTMAN, JK ;
WOLFE, R ;
GYORGY, EM ;
FINN, PL ;
KRYDER, MH ;
CHANG, CH .
APPLIED PHYSICS LETTERS, 1992, 61 (02) :142-144
[5]   POLARIZATION CONTRAST IN NEAR-FIELD SCANNING OPTICAL MICROSCOPY [J].
BETZIG, E ;
TRAUTMAN, JK ;
WEINER, JS ;
HARRIS, TD ;
WOLFE, R .
APPLIED OPTICS, 1992, 31 (22) :4563-4568
[6]   EXTERNAL AND INTERNAL-REFLECTION NEAR-FIELD MICROSCOPY - EXPERIMENTS AND RESULTS [J].
COURJON, D ;
VIGOUREUX, JM ;
SPAJER, M ;
SARAYEDDINE, K ;
LEBLANC, S .
APPLIED OPTICS, 1990, 29 (26) :3734-3740
[7]  
DEFORNEL F, 1989, P SOC PHOTO-OPT INS, V1139, P77, DOI 10.1117/12.961777
[8]   NEAR-FIELD OPTICAL-SCANNING MICROSCOPY [J].
DURIG, U ;
POHL, DW ;
ROHNER, F .
JOURNAL OF APPLIED PHYSICS, 1986, 59 (10) :3318-3327
[9]   NEAR-FIELD OPTICAL-SCANNING MICROSCOPY IN REFLECTION [J].
FISCHER, UC ;
DURIG, UT ;
POHL, DW .
APPLIED PHYSICS LETTERS, 1988, 52 (04) :249-251
[10]   SUPERRESOLUTION FLUORESCENCE NEAR-FIELD SCANNING OPTICAL MICROSCOPY [J].
HAROOTUNIAN, A ;
BETZIG, E ;
ISAACSON, M ;
LEWIS, A .
APPLIED PHYSICS LETTERS, 1986, 49 (11) :674-676