DIGITAL SCANNING AUGER-ELECTRON MICROSCOPE

被引：4

作者：

BROWNING, R ^{[1
]}

ELGOMATI, MM ^{[1
]}

PRUTTON, M ^{[1
]}

机构：

[1] UNIV YORK,DEPT PHYS,YORK Y01 5DD,N YORKSHIRE,ENGLAND

来源：

关键词：

D O I：

10.1016/0039-6028(77)90218-7

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

引用

页码：328 / 337

页数：10

共 13 条

[1] IMPROVED AUGER-ELECTRON SPECTROMETER USING CONCENTRIC HEMISPHERES
BASSETT, PJ
[J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1974, 7 (06): : 461 - 463
[2] BISHOP HE, 1974, AERE7899 REP
[3] BISHOP HE, 1971, SURF SCI, V27, P1
[4] BROWNING R, TO BE PUBLISHED
[5] ELECTRON GUN USING A FIELD EMISSION SOURCE
CREWE, AV
EGGENBER.DN
WALL, J
WELTER, LM
[J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 1968, 39 (04) : 576 - &
[6] NEW SEMI-AUGER MICROANALYZER WITH UHV CAPABILITY
ISHIDA, T
UCHIYAMA, M
ODA, Z
HASHIMOTO, H
[J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1976, 13 (03): : 711 - 715
[7] RATIO TECHNIQUE FOR MICRO-AUGER ANALYSIS
JANSSEN, AP
HARLAND, CJ
VENABLES, JA
[J]. SURFACE SCIENCE, 1977, 62 (01) : 277 - 292
[8] AUGER ELECTRON SPECTROSCOPY IN SCANNING ELECTRON MICROSCOPE - AUGER ELECTRON IMAGES
MACDONALD, NC
WALDROP, JR
[J]. APPLIED PHYSICS LETTERS, 1971, 19 (09) : 315 - +
[9] SCANNING AUGER-ELECTRON MICROSCOPE FOR SURFACE STUDIES
POWELL, BD
WOODRUFF, DP
GRIFFITHS, BW
[J]. JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1975, 8 (07): : 548 - 552
[10] THEORETICAL COMPARISON OF ELECTRON-ENERGY ANALYZERS DEGRADED SO AS TO OBTAIN HIGH SENSITIVITY
PRUTTON, M
[J]. JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1977, 11 (02) : 197 - 204