ELECTRICAL CHARACTERIZATION OF LIQUID-PHASE EPITAXIALLY GROWN SINGLE-CRYSTAL FILMS OF MERCURY CADMIUM TELLURIDE BY VARIABLE-MAGNETIC-FIELD HALL MEASUREMENTS

被引：10

作者：

KIM, JS ^{[1
]}

SEILER, DG ^{[1
]}

COLOMBO, L ^{[1
]}

CHEN, MC ^{[1
]}

机构：

[1] TEXAS INSTRUMENTS INC,DALLAS,TX 75265

来源：

SEMICONDUCTOR SCIENCE AND TECHNOLOGY | 1994年 / 9卷 / 09期

关键词：

D O I：

10.1088/0268-1242/9/9/020

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We report a method for a new classification procedure for liquid-phase epitaxially grown mercury cadmium telluride single crystals. Variable-magnetic-field Hall measurements are performed on nine liquid-phase epitaxially grown Hg0.78Cd0.22Te single-crystal films for magnetic fields from 0 to 1.4 T and in the temperature range from 10 K to 300 K. The data from these measurements are analysed in the context of the reduced-conductivity-tensor scheme proposed by Kim and co-workers. Based on the degree of deviation from an ideal one-carrier behaviour, these experimental samples are classified into several types to emphasize the transition in the behaviour of the normal to anomalous n-type samples, finally leading to p-type samples. Our classification is also based on a general trend in the temperature dependence of the mobility and density of the majority carriers, which were extracted from the magnetoresistivity data. The classification provides a useful benchmark for materials characterization in the infrared detector industry.

引用

页码：1696 / 1705

页数：10

共 32 条

[11] CARRIER FREEZE-OUT AND ACCEPTOR ENERGIES IN P-TYPE HG1-XCDXTE [J].