RADIATION-DAMAGE ASSESSMENT OF NB TUNNEL JUNCTION DEVICES

被引：11

作者：

KING, SE

MAGNO, R

MAISCH, WG

机构：

[1] Naval Research Laboratory, Washington, DC 20375

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 1991年 / 38卷 / 06期

关键词：

D O I：

10.1109/23.124117

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The radiation hardness of a new technology using Josephson junctions was explored by an irradiation using a fluence of 7.6 x 10(14) protons/cm2 at an energy of 63 MeV from the U.C. Davis cyclotron. In what we believe is the first radiation assessment of Nb/Al2O3/Nb devices, the permanent damage in these devices was investigated. No permanent changes in the I-V characteristics of the junctions were observed indicating no significant level of material defects have occurred at this level of irradiation.

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页码：1359 / 1364

页数：6

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