RESIDUAL-STRESS MEASUREMENTS ON CHROMIUM FILMS BY X-RAY-DIFFRACTION USING SIN2-PSI METHOD

被引：23

作者：

WONG, SM

机构：

来源：

关键词：

D O I：

10.1016/0040-6090(78)90374-7

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：65 / 71

页数：7

共 36 条

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