PHOTOCONDUCTIVITY AS A TOOL FOR STUDY OF DEEP ELECTRONIC TRAPS OF METAL-OXIDE-SILICON SANDWICHES

被引：1

作者：

BARRUEL, F

PFISTER, JC

机构：

来源：

PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1972年 / 10卷 / 02期

关键词：

D O I：

10.1002/pssa.2210100225

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：555 / &

共 9 条

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[5]

PAUTRAT JL, 1970, THESIS U GRENOBLE

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PAUTRAT, JL ;

PFISTER, JC .

WILLIAMS, R .

[9] PHOTOEMISSION OF ELECTRONS FROM SILICON INTO SILICON DIOXIDE [J].

WILLIAMS, R .

PHYSICAL REVIEW, 1965, 140 (2A) :A569-&