NUCLEATION OF COPPER ON TIW AND TIN DURING CHEMICAL-VAPOR-DEPOSITION

被引:25
作者
KIM, DH
WENTORF, RH
GILL, WN
机构
[1] Center for Integrated Electronics, Department of Chemical Engineering, Rensselaer Polytechnic Institute, Troy
关键词
D O I
10.1063/1.354280
中图分类号
O59 [应用物理学];
学科分类号
摘要
Copper grows as continuous films on various silicides and metals at substrate temperatures of 310-385-degrees-C, total pressures of 2-10 Torr, and precursor vessel temperatures of 60-80-degrees-C (precursor mole fractions of 0.004-0.35) with hydrogen using copper (II) hexafluoroacetylacetonate [Cu(HFA)2] as the precursor. However, on TiW, TiW:N, and TiN substrates, that were previously exposed to air, copper formed only small crystalline aggregates, not continuous films, perhaps because of a thin surface layer of oxide. This conclusion was supported by Auger electron spectroscopy and scanning electron microscopy analyses.
引用
收藏
页码:5164 / 5166
页数:3
相关论文
共 9 条
[1]   INTER-DIFFUSION AND COMPOUND FORMATION IN THE C-SI/PTSI/(TI-W)/A1 SYSTEM [J].
CANALI, C ;
CELOTTI, G ;
FANTINI, F ;
ZANONI, E .
THIN SOLID FILMS, 1982, 88 (01) :9-23
[2]  
GUPTA S, 1982, OCT SEM INT, P80
[3]  
HOSHINO K, 1989, P IEEE VLSI MULTILEV, P226
[4]   OXIDATION AND PROTECTION IN COPPER AND COPPER ALLOY THIN-FILMS [J].
LI, J ;
MAYER, JW ;
COLGAN, EG .
JOURNAL OF APPLIED PHYSICS, 1991, 70 (05) :2820-2827
[5]  
LI J, 1993, P IEEE, P153
[6]   INTERDIFFUSIONS IN CU/REACTIVE-ION-SPUTTERED TIN, CU/CHEMICAL-VAPOR-DEPOSITED TIN, CU/TAN, AND TAN/CU/TAN THIN-FILM STRUCTURES - LOW-TEMPERATURE DIFFUSION ANALYSES [J].
OLOWOLAFE, JO ;
MOGAB, CJ ;
GREGORY, RB ;
KOTTKE, M .
JOURNAL OF APPLIED PHYSICS, 1992, 72 (09) :4099-4103
[7]  
PAI PL, 1989, 6TH P VLSI MULT INT, P258
[8]   COMPOUND FORMATION AND BONDING CONFIGURATION AT THE SI-CU INTERFACE [J].
ROSSI, G ;
LINDAU, I .
PHYSICAL REVIEW B, 1983, 28 (06) :3597-3600
[9]   OXYGEN IN TITANIUM NITRIDE DIFFUSION-BARRIERS [J].
SINKE, W ;
FRIJILINK, GPA ;
SARIS, FW .
APPLIED PHYSICS LETTERS, 1985, 47 (05) :471-473