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INTER-DIFFUSION AND COMPOUND FORMATION IN THE C-SI/PTSI/(TI-W)/A1 SYSTEM
被引:50
作者
:
CANALI, C
论文数:
0
引用数:
0
h-index:
0
机构:
CNR,IST LAB MAT ELETTRON,I-40126 BOLOGNA,ITALY
CANALI, C
CELOTTI, G
论文数:
0
引用数:
0
h-index:
0
机构:
CNR,IST LAB MAT ELETTRON,I-40126 BOLOGNA,ITALY
CELOTTI, G
FANTINI, F
论文数:
0
引用数:
0
h-index:
0
机构:
CNR,IST LAB MAT ELETTRON,I-40126 BOLOGNA,ITALY
FANTINI, F
ZANONI, E
论文数:
0
引用数:
0
h-index:
0
机构:
CNR,IST LAB MAT ELETTRON,I-40126 BOLOGNA,ITALY
ZANONI, E
机构
:
[1]
CNR,IST LAB MAT ELETTRON,I-40126 BOLOGNA,ITALY
[2]
TELETTRA SPA,I-20059 VIMERCATE,ITALY
[3]
UNIV MODENA,IST FIS,I-41100 MODENA,ITALY
来源
:
THIN SOLID FILMS
|
1982年
/ 88卷
/ 01期
关键词
:
D O I
:
10.1016/0040-6090(82)90345-5
中图分类号
:
T [工业技术];
学科分类号
:
08 ;
摘要
:
引用
收藏
页码:9 / 23
页数:15
相关论文
共 18 条
[1]
RELIABILITY PROBLEMS IN TTL-LS DEVICES
CANALI, C
论文数:
0
引用数:
0
h-index:
0
机构:
TELETTRA SPA,DIV RELIABIL & QUAL,I-20059 VIMERCATE,ITALY
CANALI, C
FANTINI, F
论文数:
0
引用数:
0
h-index:
0
机构:
TELETTRA SPA,DIV RELIABIL & QUAL,I-20059 VIMERCATE,ITALY
FANTINI, F
GAVIRAGHI, S
论文数:
0
引用数:
0
h-index:
0
机构:
TELETTRA SPA,DIV RELIABIL & QUAL,I-20059 VIMERCATE,ITALY
GAVIRAGHI, S
SENIN, A
论文数:
0
引用数:
0
h-index:
0
机构:
TELETTRA SPA,DIV RELIABIL & QUAL,I-20059 VIMERCATE,ITALY
SENIN, A
[J].
MICROELECTRONICS AND RELIABILITY,
1981,
21
(05):
: 637
-
651
[2]
METALLIZATION IN MICROELECTRONICS
GHATE, PB
论文数:
0
引用数:
0
h-index:
0
机构:
TEXAS INSTRUMENTS INC, SEMICOND RES & ENGN LABS, DALLAS, TX 75222 USA
TEXAS INSTRUMENTS INC, SEMICOND RES & ENGN LABS, DALLAS, TX 75222 USA
GHATE, PB
BLAIR, JC
论文数:
0
引用数:
0
h-index:
0
机构:
TEXAS INSTRUMENTS INC, SEMICOND RES & ENGN LABS, DALLAS, TX 75222 USA
TEXAS INSTRUMENTS INC, SEMICOND RES & ENGN LABS, DALLAS, TX 75222 USA
BLAIR, JC
FULLER, CR
论文数:
0
引用数:
0
h-index:
0
机构:
TEXAS INSTRUMENTS INC, SEMICOND RES & ENGN LABS, DALLAS, TX 75222 USA
TEXAS INSTRUMENTS INC, SEMICOND RES & ENGN LABS, DALLAS, TX 75222 USA
FULLER, CR
[J].
THIN SOLID FILMS,
1977,
45
(01)
: 69
-
84
[3]
APPLICATION OF TI-W BARRIER METALLIZATION FOR INTEGRATED-CIRCUITS
GHATE, PB
论文数:
0
引用数:
0
h-index:
0
GHATE, PB
BLAIR, JC
论文数:
0
引用数:
0
h-index:
0
BLAIR, JC
FULLER, CR
论文数:
0
引用数:
0
h-index:
0
FULLER, CR
MCGUIRE, GE
论文数:
0
引用数:
0
h-index:
0
MCGUIRE, GE
[J].
THIN SOLID FILMS,
1978,
53
(02)
: 117
-
128
[4]
GOLDSMITH CC, 1978, 16TH P ANN S REL PHY, P64
[5]
STUDIES OF TI-W METALLIZATION SYSTEM ON SI
HARRIS, JM
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91125
HARRIS, JM
LAU, SS
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91125
LAU, SS
NICOLET, MA
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91125
NICOLET, MA
NOWICKI, RS
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91125
NOWICKI, RS
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1976,
123
(01)
: 120
-
124
[6]
ELECTRICAL AND MECHANICAL FEATURES OF PLATINUM SILICIDE-ALUMINUM REACTION
HOSACK, HH
论文数:
0
引用数:
0
h-index:
0
机构:
GE CO, SYRACUSE, NY 13201 USA
GE CO, SYRACUSE, NY 13201 USA
HOSACK, HH
[J].
JOURNAL OF APPLIED PHYSICS,
1973,
44
(08)
: 3476
-
3485
[7]
CHANNELING AND BACKSCATTERING STUDIES OF THE CRYSTALLINE PERFECTION AND THE THERMAL-STABILITY OF EPITAXIAL PTSI FILMS ON SI
ISHIWARA, H
论文数:
0
引用数:
0
h-index:
0
机构:
TOKYO INST TECHNOL, GRAD SCH SCI & ENGN, MIDORI KU, YOKOHAMA 227, JAPAN
TOKYO INST TECHNOL, GRAD SCH SCI & ENGN, MIDORI KU, YOKOHAMA 227, JAPAN
ISHIWARA, H
HIKOSAKA, K
论文数:
0
引用数:
0
h-index:
0
机构:
TOKYO INST TECHNOL, GRAD SCH SCI & ENGN, MIDORI KU, YOKOHAMA 227, JAPAN
TOKYO INST TECHNOL, GRAD SCH SCI & ENGN, MIDORI KU, YOKOHAMA 227, JAPAN
HIKOSAKA, K
论文数:
引用数:
h-index:
机构:
FURUKAWA, S
[J].
JOURNAL OF APPLIED PHYSICS,
1979,
50
(08)
: 5302
-
5306
[8]
HETEROSTRUCTURE BY SOLID-PHASE EPITAXY IN SI(111)-PD-SI(AMORPHOUS) SYSTEM
LAU, SS
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91125
CALTECH,PASADENA,CA 91125
LAU, SS
LIAU, ZL
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91125
CALTECH,PASADENA,CA 91125
LIAU, ZL
NICOLET, MA
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91125
CALTECH,PASADENA,CA 91125
NICOLET, MA
MAYER, JW
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91125
CALTECH,PASADENA,CA 91125
MAYER, JW
[J].
JOURNAL OF APPLIED PHYSICS,
1977,
48
(03)
: 917
-
919
[9]
DIFFUSION BARRIERS IN THIN-FILMS
NICOLET, MA
论文数:
0
引用数:
0
h-index:
0
NICOLET, MA
[J].
THIN SOLID FILMS,
1978,
52
(03)
: 415
-
443
[10]
STUDIES OF TI-W-AU METALLIZATION ON ALUMINUM
NOWICKI, RS
论文数:
0
引用数:
0
h-index:
0
机构:
CHALK RIVER NUCL LABS,CHALK RIVER,ONTARIO,CANADA
NOWICKI, RS
HARRIS, JM
论文数:
0
引用数:
0
h-index:
0
机构:
CHALK RIVER NUCL LABS,CHALK RIVER,ONTARIO,CANADA
HARRIS, JM
NICOLET, MA
论文数:
0
引用数:
0
h-index:
0
机构:
CHALK RIVER NUCL LABS,CHALK RIVER,ONTARIO,CANADA
NICOLET, MA
MITCHELL, IV
论文数:
0
引用数:
0
h-index:
0
机构:
CHALK RIVER NUCL LABS,CHALK RIVER,ONTARIO,CANADA
MITCHELL, IV
[J].
THIN SOLID FILMS,
1978,
53
(02)
: 195
-
205
←
1
2
→
共 18 条
[1]
RELIABILITY PROBLEMS IN TTL-LS DEVICES
CANALI, C
论文数:
0
引用数:
0
h-index:
0
机构:
TELETTRA SPA,DIV RELIABIL & QUAL,I-20059 VIMERCATE,ITALY
CANALI, C
FANTINI, F
论文数:
0
引用数:
0
h-index:
0
机构:
TELETTRA SPA,DIV RELIABIL & QUAL,I-20059 VIMERCATE,ITALY
FANTINI, F
GAVIRAGHI, S
论文数:
0
引用数:
0
h-index:
0
机构:
TELETTRA SPA,DIV RELIABIL & QUAL,I-20059 VIMERCATE,ITALY
GAVIRAGHI, S
SENIN, A
论文数:
0
引用数:
0
h-index:
0
机构:
TELETTRA SPA,DIV RELIABIL & QUAL,I-20059 VIMERCATE,ITALY
SENIN, A
[J].
MICROELECTRONICS AND RELIABILITY,
1981,
21
(05):
: 637
-
651
[2]
METALLIZATION IN MICROELECTRONICS
GHATE, PB
论文数:
0
引用数:
0
h-index:
0
机构:
TEXAS INSTRUMENTS INC, SEMICOND RES & ENGN LABS, DALLAS, TX 75222 USA
TEXAS INSTRUMENTS INC, SEMICOND RES & ENGN LABS, DALLAS, TX 75222 USA
GHATE, PB
BLAIR, JC
论文数:
0
引用数:
0
h-index:
0
机构:
TEXAS INSTRUMENTS INC, SEMICOND RES & ENGN LABS, DALLAS, TX 75222 USA
TEXAS INSTRUMENTS INC, SEMICOND RES & ENGN LABS, DALLAS, TX 75222 USA
BLAIR, JC
FULLER, CR
论文数:
0
引用数:
0
h-index:
0
机构:
TEXAS INSTRUMENTS INC, SEMICOND RES & ENGN LABS, DALLAS, TX 75222 USA
TEXAS INSTRUMENTS INC, SEMICOND RES & ENGN LABS, DALLAS, TX 75222 USA
FULLER, CR
[J].
THIN SOLID FILMS,
1977,
45
(01)
: 69
-
84
[3]
APPLICATION OF TI-W BARRIER METALLIZATION FOR INTEGRATED-CIRCUITS
GHATE, PB
论文数:
0
引用数:
0
h-index:
0
GHATE, PB
BLAIR, JC
论文数:
0
引用数:
0
h-index:
0
BLAIR, JC
FULLER, CR
论文数:
0
引用数:
0
h-index:
0
FULLER, CR
MCGUIRE, GE
论文数:
0
引用数:
0
h-index:
0
MCGUIRE, GE
[J].
THIN SOLID FILMS,
1978,
53
(02)
: 117
-
128
[4]
GOLDSMITH CC, 1978, 16TH P ANN S REL PHY, P64
[5]
STUDIES OF TI-W METALLIZATION SYSTEM ON SI
HARRIS, JM
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91125
HARRIS, JM
LAU, SS
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91125
LAU, SS
NICOLET, MA
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91125
NICOLET, MA
NOWICKI, RS
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91125
NOWICKI, RS
[J].
JOURNAL OF THE ELECTROCHEMICAL SOCIETY,
1976,
123
(01)
: 120
-
124
[6]
ELECTRICAL AND MECHANICAL FEATURES OF PLATINUM SILICIDE-ALUMINUM REACTION
HOSACK, HH
论文数:
0
引用数:
0
h-index:
0
机构:
GE CO, SYRACUSE, NY 13201 USA
GE CO, SYRACUSE, NY 13201 USA
HOSACK, HH
[J].
JOURNAL OF APPLIED PHYSICS,
1973,
44
(08)
: 3476
-
3485
[7]
CHANNELING AND BACKSCATTERING STUDIES OF THE CRYSTALLINE PERFECTION AND THE THERMAL-STABILITY OF EPITAXIAL PTSI FILMS ON SI
ISHIWARA, H
论文数:
0
引用数:
0
h-index:
0
机构:
TOKYO INST TECHNOL, GRAD SCH SCI & ENGN, MIDORI KU, YOKOHAMA 227, JAPAN
TOKYO INST TECHNOL, GRAD SCH SCI & ENGN, MIDORI KU, YOKOHAMA 227, JAPAN
ISHIWARA, H
HIKOSAKA, K
论文数:
0
引用数:
0
h-index:
0
机构:
TOKYO INST TECHNOL, GRAD SCH SCI & ENGN, MIDORI KU, YOKOHAMA 227, JAPAN
TOKYO INST TECHNOL, GRAD SCH SCI & ENGN, MIDORI KU, YOKOHAMA 227, JAPAN
HIKOSAKA, K
论文数:
引用数:
h-index:
机构:
FURUKAWA, S
[J].
JOURNAL OF APPLIED PHYSICS,
1979,
50
(08)
: 5302
-
5306
[8]
HETEROSTRUCTURE BY SOLID-PHASE EPITAXY IN SI(111)-PD-SI(AMORPHOUS) SYSTEM
LAU, SS
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91125
CALTECH,PASADENA,CA 91125
LAU, SS
LIAU, ZL
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91125
CALTECH,PASADENA,CA 91125
LIAU, ZL
NICOLET, MA
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91125
CALTECH,PASADENA,CA 91125
NICOLET, MA
MAYER, JW
论文数:
0
引用数:
0
h-index:
0
机构:
CALTECH,PASADENA,CA 91125
CALTECH,PASADENA,CA 91125
MAYER, JW
[J].
JOURNAL OF APPLIED PHYSICS,
1977,
48
(03)
: 917
-
919
[9]
DIFFUSION BARRIERS IN THIN-FILMS
NICOLET, MA
论文数:
0
引用数:
0
h-index:
0
NICOLET, MA
[J].
THIN SOLID FILMS,
1978,
52
(03)
: 415
-
443
[10]
STUDIES OF TI-W-AU METALLIZATION ON ALUMINUM
NOWICKI, RS
论文数:
0
引用数:
0
h-index:
0
机构:
CHALK RIVER NUCL LABS,CHALK RIVER,ONTARIO,CANADA
NOWICKI, RS
HARRIS, JM
论文数:
0
引用数:
0
h-index:
0
机构:
CHALK RIVER NUCL LABS,CHALK RIVER,ONTARIO,CANADA
HARRIS, JM
NICOLET, MA
论文数:
0
引用数:
0
h-index:
0
机构:
CHALK RIVER NUCL LABS,CHALK RIVER,ONTARIO,CANADA
NICOLET, MA
MITCHELL, IV
论文数:
0
引用数:
0
h-index:
0
机构:
CHALK RIVER NUCL LABS,CHALK RIVER,ONTARIO,CANADA
MITCHELL, IV
[J].
THIN SOLID FILMS,
1978,
53
(02)
: 195
-
205
←
1
2
→